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Origin of Symmetric Dimer Images of Si(001) Observed by Low-Temperature Scanning Tunneling Microscopy

It has been a long-standing puzzle why buckled dimers of the Si(001) surface appeared symmetric below ~20 K in scanning tunneling microscopy (STM) experiments. Although such symmetric dimer images were concluded to be due to an artifact induced by STM measurements, its underlying mechanism is still...

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Autores principales: Ren, Xiao-Yan, Kim, Hyun-Jung, Niu, Chun-Yao, Jia, Yu, Cho, Jun-Hyung
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4904415/
https://www.ncbi.nlm.nih.gov/pubmed/27292000
http://dx.doi.org/10.1038/srep27868
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author Ren, Xiao-Yan
Kim, Hyun-Jung
Niu, Chun-Yao
Jia, Yu
Cho, Jun-Hyung
author_facet Ren, Xiao-Yan
Kim, Hyun-Jung
Niu, Chun-Yao
Jia, Yu
Cho, Jun-Hyung
author_sort Ren, Xiao-Yan
collection PubMed
description It has been a long-standing puzzle why buckled dimers of the Si(001) surface appeared symmetric below ~20 K in scanning tunneling microscopy (STM) experiments. Although such symmetric dimer images were concluded to be due to an artifact induced by STM measurements, its underlying mechanism is still veiled. Here, we demonstrate, based on a first-principles density-functional theory calculation, that the symmetric dimer images are originated from the flip-flop motion of buckled dimers, driven by quantum tunneling (QT). It is revealed that at low temperature the tunneling-induced surface charging with holes reduces the energy barrier for the flipping of buckled dimers, thereby giving rise to a sizable QT-driven frequency of the flip-flop motion. However, such a QT phenomenon becomes marginal in the tunneling-induced surface charging with electrons. Our findings provide an explanation for low-temperature STM data that exhibits apparent symmetric (buckled) dimer structure in the filled-state (empty-state) images.
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spelling pubmed-49044152016-06-14 Origin of Symmetric Dimer Images of Si(001) Observed by Low-Temperature Scanning Tunneling Microscopy Ren, Xiao-Yan Kim, Hyun-Jung Niu, Chun-Yao Jia, Yu Cho, Jun-Hyung Sci Rep Article It has been a long-standing puzzle why buckled dimers of the Si(001) surface appeared symmetric below ~20 K in scanning tunneling microscopy (STM) experiments. Although such symmetric dimer images were concluded to be due to an artifact induced by STM measurements, its underlying mechanism is still veiled. Here, we demonstrate, based on a first-principles density-functional theory calculation, that the symmetric dimer images are originated from the flip-flop motion of buckled dimers, driven by quantum tunneling (QT). It is revealed that at low temperature the tunneling-induced surface charging with holes reduces the energy barrier for the flipping of buckled dimers, thereby giving rise to a sizable QT-driven frequency of the flip-flop motion. However, such a QT phenomenon becomes marginal in the tunneling-induced surface charging with electrons. Our findings provide an explanation for low-temperature STM data that exhibits apparent symmetric (buckled) dimer structure in the filled-state (empty-state) images. Nature Publishing Group 2016-06-13 /pmc/articles/PMC4904415/ /pubmed/27292000 http://dx.doi.org/10.1038/srep27868 Text en Copyright © 2016, Macmillan Publishers Limited http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Article
Ren, Xiao-Yan
Kim, Hyun-Jung
Niu, Chun-Yao
Jia, Yu
Cho, Jun-Hyung
Origin of Symmetric Dimer Images of Si(001) Observed by Low-Temperature Scanning Tunneling Microscopy
title Origin of Symmetric Dimer Images of Si(001) Observed by Low-Temperature Scanning Tunneling Microscopy
title_full Origin of Symmetric Dimer Images of Si(001) Observed by Low-Temperature Scanning Tunneling Microscopy
title_fullStr Origin of Symmetric Dimer Images of Si(001) Observed by Low-Temperature Scanning Tunneling Microscopy
title_full_unstemmed Origin of Symmetric Dimer Images of Si(001) Observed by Low-Temperature Scanning Tunneling Microscopy
title_short Origin of Symmetric Dimer Images of Si(001) Observed by Low-Temperature Scanning Tunneling Microscopy
title_sort origin of symmetric dimer images of si(001) observed by low-temperature scanning tunneling microscopy
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4904415/
https://www.ncbi.nlm.nih.gov/pubmed/27292000
http://dx.doi.org/10.1038/srep27868
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