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NIST High Accuracy Reference Reflectometer-Spectrophotometer

A new reflectometer-spectrophotometer has been designed and constructed using state-of-the-art technology to enhance optical properties of materials measurements over the ultraviolet, visible, and near-infrared (UV-Vis-NIR) wavelength range (200 nm to 2500 nm). The instrument, Spectral Tri-function...

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Detalles Bibliográficos
Autores principales: Proctor, James E., Yvonne Barnes, P.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1996
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4907617/
https://www.ncbi.nlm.nih.gov/pubmed/27805081
http://dx.doi.org/10.6028/jres.101.061
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author Proctor, James E.
Yvonne Barnes, P.
author_facet Proctor, James E.
Yvonne Barnes, P.
author_sort Proctor, James E.
collection PubMed
description A new reflectometer-spectrophotometer has been designed and constructed using state-of-the-art technology to enhance optical properties of materials measurements over the ultraviolet, visible, and near-infrared (UV-Vis-NIR) wavelength range (200 nm to 2500 nm). The instrument, Spectral Tri-function Automated Reference Reflectometer (STARR), is capable of measuring specular and diffuse reflectance, bidirectional reflectance distribution function (BRDF) of diffuse samples, and both diffuse and non-diffuse transmittance. Samples up to 30 cm by 30 cm can be measured. The instrument and its characterization are described.
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spelling pubmed-49076172016-10-28 NIST High Accuracy Reference Reflectometer-Spectrophotometer Proctor, James E. Yvonne Barnes, P. J Res Natl Inst Stand Technol Article A new reflectometer-spectrophotometer has been designed and constructed using state-of-the-art technology to enhance optical properties of materials measurements over the ultraviolet, visible, and near-infrared (UV-Vis-NIR) wavelength range (200 nm to 2500 nm). The instrument, Spectral Tri-function Automated Reference Reflectometer (STARR), is capable of measuring specular and diffuse reflectance, bidirectional reflectance distribution function (BRDF) of diffuse samples, and both diffuse and non-diffuse transmittance. Samples up to 30 cm by 30 cm can be measured. The instrument and its characterization are described. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1996 /pmc/articles/PMC4907617/ /pubmed/27805081 http://dx.doi.org/10.6028/jres.101.061 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Proctor, James E.
Yvonne Barnes, P.
NIST High Accuracy Reference Reflectometer-Spectrophotometer
title NIST High Accuracy Reference Reflectometer-Spectrophotometer
title_full NIST High Accuracy Reference Reflectometer-Spectrophotometer
title_fullStr NIST High Accuracy Reference Reflectometer-Spectrophotometer
title_full_unstemmed NIST High Accuracy Reference Reflectometer-Spectrophotometer
title_short NIST High Accuracy Reference Reflectometer-Spectrophotometer
title_sort nist high accuracy reference reflectometer-spectrophotometer
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4907617/
https://www.ncbi.nlm.nih.gov/pubmed/27805081
http://dx.doi.org/10.6028/jres.101.061
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