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NIST High Accuracy Reference Reflectometer-Spectrophotometer
A new reflectometer-spectrophotometer has been designed and constructed using state-of-the-art technology to enhance optical properties of materials measurements over the ultraviolet, visible, and near-infrared (UV-Vis-NIR) wavelength range (200 nm to 2500 nm). The instrument, Spectral Tri-function...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1996
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4907617/ https://www.ncbi.nlm.nih.gov/pubmed/27805081 http://dx.doi.org/10.6028/jres.101.061 |
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author | Proctor, James E. Yvonne Barnes, P. |
author_facet | Proctor, James E. Yvonne Barnes, P. |
author_sort | Proctor, James E. |
collection | PubMed |
description | A new reflectometer-spectrophotometer has been designed and constructed using state-of-the-art technology to enhance optical properties of materials measurements over the ultraviolet, visible, and near-infrared (UV-Vis-NIR) wavelength range (200 nm to 2500 nm). The instrument, Spectral Tri-function Automated Reference Reflectometer (STARR), is capable of measuring specular and diffuse reflectance, bidirectional reflectance distribution function (BRDF) of diffuse samples, and both diffuse and non-diffuse transmittance. Samples up to 30 cm by 30 cm can be measured. The instrument and its characterization are described. |
format | Online Article Text |
id | pubmed-4907617 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 1996 |
publisher | [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology |
record_format | MEDLINE/PubMed |
spelling | pubmed-49076172016-10-28 NIST High Accuracy Reference Reflectometer-Spectrophotometer Proctor, James E. Yvonne Barnes, P. J Res Natl Inst Stand Technol Article A new reflectometer-spectrophotometer has been designed and constructed using state-of-the-art technology to enhance optical properties of materials measurements over the ultraviolet, visible, and near-infrared (UV-Vis-NIR) wavelength range (200 nm to 2500 nm). The instrument, Spectral Tri-function Automated Reference Reflectometer (STARR), is capable of measuring specular and diffuse reflectance, bidirectional reflectance distribution function (BRDF) of diffuse samples, and both diffuse and non-diffuse transmittance. Samples up to 30 cm by 30 cm can be measured. The instrument and its characterization are described. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1996 /pmc/articles/PMC4907617/ /pubmed/27805081 http://dx.doi.org/10.6028/jres.101.061 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright. |
spellingShingle | Article Proctor, James E. Yvonne Barnes, P. NIST High Accuracy Reference Reflectometer-Spectrophotometer |
title | NIST High Accuracy Reference Reflectometer-Spectrophotometer |
title_full | NIST High Accuracy Reference Reflectometer-Spectrophotometer |
title_fullStr | NIST High Accuracy Reference Reflectometer-Spectrophotometer |
title_full_unstemmed | NIST High Accuracy Reference Reflectometer-Spectrophotometer |
title_short | NIST High Accuracy Reference Reflectometer-Spectrophotometer |
title_sort | nist high accuracy reference reflectometer-spectrophotometer |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4907617/ https://www.ncbi.nlm.nih.gov/pubmed/27805081 http://dx.doi.org/10.6028/jres.101.061 |
work_keys_str_mv | AT proctorjamese nisthighaccuracyreferencereflectometerspectrophotometer AT yvonnebarnesp nisthighaccuracyreferencereflectometerspectrophotometer |