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Accuracy of the Double Variation Technique of Refractive Index Measurement
Errors in the double variation teclinique of refractive index measurement are analyzed using a new approach. The ability to measure matching wavelength is characterized, along with the effect on the calculated refractive index. Refractive index accuracy and precision are very dependent on the specif...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1992
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4909191/ https://www.ncbi.nlm.nih.gov/pubmed/28053453 http://dx.doi.org/10.6028/jres.097.033 |
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author | Verkouteren, Jennifer R. Steel, Eric B. Windsor, Eric S. Phelps, John M. |
author_facet | Verkouteren, Jennifer R. Steel, Eric B. Windsor, Eric S. Phelps, John M. |
author_sort | Verkouteren, Jennifer R. |
collection | PubMed |
description | Errors in the double variation teclinique of refractive index measurement are analyzed using a new approach. The ability to measure matching wavelength is characterized, along with the effect on the calculated refractive index. Refractive index accuracy and precision are very dependent on the specifics of each calibration set, particularly the difference in dispersion between the liquid and solid. Our best precision (±1 or 2×10(−4)) is attained only when the difference in dispersion between liquid and solid is small, and is dependent on an individual operator’s ability to perceive changes in relief. This precision is impossible to achieve for the other glass/liquid combinations, where we are limited by a precision of approximately 1 nm in the selection of matching wavelength. A bias in the measurement of matching wavelength exists that affects the accuracy of the calculated refractive indices. The magnitude of the bias appears to be controlled by the bandpass of the graded interference filter. The errors in refractive index using a graded interference filter with a bandpass of 30 nm FWHM (full width at half maximum intensity) are an order of magnitude larger than the errors using a filter with a bandpass of 15 nm FWHM. |
format | Online Article Text |
id | pubmed-4909191 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 1992 |
publisher | [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology |
record_format | MEDLINE/PubMed |
spelling | pubmed-49091912017-01-04 Accuracy of the Double Variation Technique of Refractive Index Measurement Verkouteren, Jennifer R. Steel, Eric B. Windsor, Eric S. Phelps, John M. J Res Natl Inst Stand Technol Article Errors in the double variation teclinique of refractive index measurement are analyzed using a new approach. The ability to measure matching wavelength is characterized, along with the effect on the calculated refractive index. Refractive index accuracy and precision are very dependent on the specifics of each calibration set, particularly the difference in dispersion between the liquid and solid. Our best precision (±1 or 2×10(−4)) is attained only when the difference in dispersion between liquid and solid is small, and is dependent on an individual operator’s ability to perceive changes in relief. This precision is impossible to achieve for the other glass/liquid combinations, where we are limited by a precision of approximately 1 nm in the selection of matching wavelength. A bias in the measurement of matching wavelength exists that affects the accuracy of the calculated refractive indices. The magnitude of the bias appears to be controlled by the bandpass of the graded interference filter. The errors in refractive index using a graded interference filter with a bandpass of 30 nm FWHM (full width at half maximum intensity) are an order of magnitude larger than the errors using a filter with a bandpass of 15 nm FWHM. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1992 /pmc/articles/PMC4909191/ /pubmed/28053453 http://dx.doi.org/10.6028/jres.097.033 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Institute of Standards and Technology is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright. |
spellingShingle | Article Verkouteren, Jennifer R. Steel, Eric B. Windsor, Eric S. Phelps, John M. Accuracy of the Double Variation Technique of Refractive Index Measurement |
title | Accuracy of the Double Variation Technique of Refractive Index Measurement |
title_full | Accuracy of the Double Variation Technique of Refractive Index Measurement |
title_fullStr | Accuracy of the Double Variation Technique of Refractive Index Measurement |
title_full_unstemmed | Accuracy of the Double Variation Technique of Refractive Index Measurement |
title_short | Accuracy of the Double Variation Technique of Refractive Index Measurement |
title_sort | accuracy of the double variation technique of refractive index measurement |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4909191/ https://www.ncbi.nlm.nih.gov/pubmed/28053453 http://dx.doi.org/10.6028/jres.097.033 |
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