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Probe-Position Error Correction in Planar Near Field Measurements at 60 GHz: Experimental Verification
This study was conducted to verify that the probe-position error correction can be successfully applied to real data obtained on a planar near-field range where probe position errors are known. Since probe position-error correction is most important at high frequencies, measurements were made at 60...
Autor principal: | |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1992
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4914235/ https://www.ncbi.nlm.nih.gov/pubmed/28053433 http://dx.doi.org/10.6028/jres.097.009 |
Sumario: | This study was conducted to verify that the probe-position error correction can be successfully applied to real data obtained on a planar near-field range where probe position errors are known. Since probe position-error correction is most important at high frequencies, measurements were made at 60 GHz. Six planar scans at z positions separated by 0.03 A were obtained. The correction technique was applied to an error-contaminated near field constructed out of the six scans according to a discretized periodic error function. The results indicate that probe position errors can be removed from real near-field data as successfully as from simulated data; some residual errors, which are thought to be due to multiple reflections, residual drift in the measurement system, and residual probe position errors in all three coordinates, are observed. |
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