Combining combing and secondary ion mass spectrometry to study DNA on chips using (13)C and (15)N labeling

Dynamic secondary ion mass spectrometry ( D-SIMS) imaging of combed DNA – the combing, imaging by SIMS or CIS method – has been developed previously using a standard NanoSIMS 50 to reveal, on the 50 nm scale, individual DNA fibers labeled with different, non-radioactive isotopes in vivo and to quant...

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Detalles Bibliográficos
Autores principales: Cabin-Flaman, Armelle, Monnier, Anne-Francoise, Coffinier, Yannick, Audinot, Jean-Nicolas, Gibouin, David, Wirtz, Tom, Boukherroub, Rabah, Migeon, Henri-Noël, Bensimon, Aaron, Jannière, Laurent, Ripoll, Camille, Norris, Victor
Formato: Online Artículo Texto
Lenguaje:English
Publicado: F1000Research 2016
Materias:
Research Note
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4943295/
https://www.ncbi.nlm.nih.gov/pubmed/27429742
http://dx.doi.org/10.12688/f1000research.8361.1

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