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Nanoforging Single Layer MoSe(2) Through Defect Engineering with Focused Helium Ion Beams

Development of devices and structures based on the layered 2D materials critically hinges on the capability to induce, control, and tailor the electronic, transport, and optoelectronic properties via defect engineering, much like doping strategies have enabled semiconductor electronics and forging e...

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Autores principales: Iberi, Vighter, Liang, Liangbo, Ievlev, Anton V., Stanford, Michael G., Lin, Ming-Wei, Li, Xufan, Mahjouri-Samani, Masoud, Jesse, Stephen, Sumpter, Bobby G., Kalinin, Sergei V., Joy, David C., Xiao, Kai, Belianinov, Alex, Ovchinnikova, Olga S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4969618/
https://www.ncbi.nlm.nih.gov/pubmed/27480346
http://dx.doi.org/10.1038/srep30481
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author Iberi, Vighter
Liang, Liangbo
Ievlev, Anton V.
Stanford, Michael G.
Lin, Ming-Wei
Li, Xufan
Mahjouri-Samani, Masoud
Jesse, Stephen
Sumpter, Bobby G.
Kalinin, Sergei V.
Joy, David C.
Xiao, Kai
Belianinov, Alex
Ovchinnikova, Olga S.
author_facet Iberi, Vighter
Liang, Liangbo
Ievlev, Anton V.
Stanford, Michael G.
Lin, Ming-Wei
Li, Xufan
Mahjouri-Samani, Masoud
Jesse, Stephen
Sumpter, Bobby G.
Kalinin, Sergei V.
Joy, David C.
Xiao, Kai
Belianinov, Alex
Ovchinnikova, Olga S.
author_sort Iberi, Vighter
collection PubMed
description Development of devices and structures based on the layered 2D materials critically hinges on the capability to induce, control, and tailor the electronic, transport, and optoelectronic properties via defect engineering, much like doping strategies have enabled semiconductor electronics and forging enabled introduction the of iron age. Here, we demonstrate the use of a scanning helium ion microscope (HIM) for tailoring the functionality of single layer MoSe(2) locally, and decipher associated mechanisms at the atomic level. We demonstrate He(+) beam bombardment that locally creates vacancies, shifts the Fermi energy landscape and increases the Young’s modulus of elasticity. Furthermore, we observe for the first time, an increase in the B-exciton photoluminescence signal from the nanoforged regions at the room temperature. The approach for precise defect engineering demonstrated here opens opportunities for creating functional 2D optoelectronic devices with a wide range of customizable properties that include operating in the visible region.
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spelling pubmed-49696182016-08-11 Nanoforging Single Layer MoSe(2) Through Defect Engineering with Focused Helium Ion Beams Iberi, Vighter Liang, Liangbo Ievlev, Anton V. Stanford, Michael G. Lin, Ming-Wei Li, Xufan Mahjouri-Samani, Masoud Jesse, Stephen Sumpter, Bobby G. Kalinin, Sergei V. Joy, David C. Xiao, Kai Belianinov, Alex Ovchinnikova, Olga S. Sci Rep Article Development of devices and structures based on the layered 2D materials critically hinges on the capability to induce, control, and tailor the electronic, transport, and optoelectronic properties via defect engineering, much like doping strategies have enabled semiconductor electronics and forging enabled introduction the of iron age. Here, we demonstrate the use of a scanning helium ion microscope (HIM) for tailoring the functionality of single layer MoSe(2) locally, and decipher associated mechanisms at the atomic level. We demonstrate He(+) beam bombardment that locally creates vacancies, shifts the Fermi energy landscape and increases the Young’s modulus of elasticity. Furthermore, we observe for the first time, an increase in the B-exciton photoluminescence signal from the nanoforged regions at the room temperature. The approach for precise defect engineering demonstrated here opens opportunities for creating functional 2D optoelectronic devices with a wide range of customizable properties that include operating in the visible region. Nature Publishing Group 2016-08-02 /pmc/articles/PMC4969618/ /pubmed/27480346 http://dx.doi.org/10.1038/srep30481 Text en Copyright © 2016, The Author(s) http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Article
Iberi, Vighter
Liang, Liangbo
Ievlev, Anton V.
Stanford, Michael G.
Lin, Ming-Wei
Li, Xufan
Mahjouri-Samani, Masoud
Jesse, Stephen
Sumpter, Bobby G.
Kalinin, Sergei V.
Joy, David C.
Xiao, Kai
Belianinov, Alex
Ovchinnikova, Olga S.
Nanoforging Single Layer MoSe(2) Through Defect Engineering with Focused Helium Ion Beams
title Nanoforging Single Layer MoSe(2) Through Defect Engineering with Focused Helium Ion Beams
title_full Nanoforging Single Layer MoSe(2) Through Defect Engineering with Focused Helium Ion Beams
title_fullStr Nanoforging Single Layer MoSe(2) Through Defect Engineering with Focused Helium Ion Beams
title_full_unstemmed Nanoforging Single Layer MoSe(2) Through Defect Engineering with Focused Helium Ion Beams
title_short Nanoforging Single Layer MoSe(2) Through Defect Engineering with Focused Helium Ion Beams
title_sort nanoforging single layer mose(2) through defect engineering with focused helium ion beams
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4969618/
https://www.ncbi.nlm.nih.gov/pubmed/27480346
http://dx.doi.org/10.1038/srep30481
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