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Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors

SPAD-based solid state CMOS image sensors utilising analogue integrators have attained deep sub-electron read noise (DSERN) permitting single photon counting (SPC) imaging. A new method is proposed to determine the read noise in DSERN image sensors by evaluating the peak separation and width (PSW) o...

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Detalles Bibliográficos
Autores principales: Dutton, Neale A. W., Gyongy, Istvan, Parmesan, Luca, Henderson, Robert K.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4970165/
https://www.ncbi.nlm.nih.gov/pubmed/27447643
http://dx.doi.org/10.3390/s16071122
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author Dutton, Neale A. W.
Gyongy, Istvan
Parmesan, Luca
Henderson, Robert K.
author_facet Dutton, Neale A. W.
Gyongy, Istvan
Parmesan, Luca
Henderson, Robert K.
author_sort Dutton, Neale A. W.
collection PubMed
description SPAD-based solid state CMOS image sensors utilising analogue integrators have attained deep sub-electron read noise (DSERN) permitting single photon counting (SPC) imaging. A new method is proposed to determine the read noise in DSERN image sensors by evaluating the peak separation and width (PSW) of single photon peaks in a photon counting histogram (PCH). The technique is used to identify and analyse cumulative noise in analogue integrating SPC SPAD-based pixels. The DSERN of our SPAD image sensor is exploited to confirm recent multi-photon threshold quanta image sensor (QIS) theory. Finally, various single and multiple photon spatio-temporal oversampling techniques are reviewed.
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spelling pubmed-49701652016-08-04 Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors Dutton, Neale A. W. Gyongy, Istvan Parmesan, Luca Henderson, Robert K. Sensors (Basel) Article SPAD-based solid state CMOS image sensors utilising analogue integrators have attained deep sub-electron read noise (DSERN) permitting single photon counting (SPC) imaging. A new method is proposed to determine the read noise in DSERN image sensors by evaluating the peak separation and width (PSW) of single photon peaks in a photon counting histogram (PCH). The technique is used to identify and analyse cumulative noise in analogue integrating SPC SPAD-based pixels. The DSERN of our SPAD image sensor is exploited to confirm recent multi-photon threshold quanta image sensor (QIS) theory. Finally, various single and multiple photon spatio-temporal oversampling techniques are reviewed. MDPI 2016-07-20 /pmc/articles/PMC4970165/ /pubmed/27447643 http://dx.doi.org/10.3390/s16071122 Text en © 2016 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC-BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Dutton, Neale A. W.
Gyongy, Istvan
Parmesan, Luca
Henderson, Robert K.
Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors
title Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors
title_full Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors
title_fullStr Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors
title_full_unstemmed Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors
title_short Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors
title_sort single photon counting performance and noise analysis of cmos spad-based image sensors
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4970165/
https://www.ncbi.nlm.nih.gov/pubmed/27447643
http://dx.doi.org/10.3390/s16071122
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