Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors

SPAD-based solid state CMOS image sensors utilising analogue integrators have attained deep sub-electron read noise (DSERN) permitting single photon counting (SPC) imaging. A new method is proposed to determine the read noise in DSERN image sensors by evaluating the peak separation and width (PSW) o...

Descripción completa

Detalles Bibliográficos
Autores principales: Dutton, Neale A. W., Gyongy, Istvan, Parmesan, Luca, Henderson, Robert K.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4970165/
https://www.ncbi.nlm.nih.gov/pubmed/27447643
http://dx.doi.org/10.3390/s16071122

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4970165/
https://www.ncbi.nlm.nih.gov/pubmed/27447643
http://dx.doi.org/10.3390/s16071122

Ejemplares similares