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Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors

SPAD-based solid state CMOS image sensors utilising analogue integrators have attained deep sub-electron read noise (DSERN) permitting single photon counting (SPC) imaging. A new method is proposed to determine the read noise in DSERN image sensors by evaluating the peak separation and width (PSW) o...

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Detalles Bibliográficos
Autores principales:	Dutton, Neale A. W., Gyongy, Istvan, Parmesan, Luca, Henderson, Robert K.
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2016
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4970165/ https://www.ncbi.nlm.nih.gov/pubmed/27447643 http://dx.doi.org/10.3390/s16071122

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