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A simple but precise method for quantitative measurement of the quality of the laser focus in a scanning optical microscope

We report a method for characterizing the focussing laser beam exiting the objective in a laser scanning microscope. This method provides the size of the optical focus, the divergence of the beam, the ellipticity and the astigmatism. We use a microscopic‐scale knife edge in the form of a simple tran...

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Detalles Bibliográficos
Autores principales: TRÄGÅRDH, J., MACRAE, K., TRAVIS, C., AMOR, R., NORRIS, G., WILSON, S.H., OPPO, G.‐L., MCCONNELL, G.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2015
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4975716/
https://www.ncbi.nlm.nih.gov/pubmed/25864964
http://dx.doi.org/10.1111/jmi.12249
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author TRÄGÅRDH, J.
MACRAE, K.
TRAVIS, C.
AMOR, R.
NORRIS, G.
WILSON, S.H.
OPPO, G.‐L.
MCCONNELL, G.
author_facet TRÄGÅRDH, J.
MACRAE, K.
TRAVIS, C.
AMOR, R.
NORRIS, G.
WILSON, S.H.
OPPO, G.‐L.
MCCONNELL, G.
author_sort TRÄGÅRDH, J.
collection PubMed
description We report a method for characterizing the focussing laser beam exiting the objective in a laser scanning microscope. This method provides the size of the optical focus, the divergence of the beam, the ellipticity and the astigmatism. We use a microscopic‐scale knife edge in the form of a simple transmission electron microscopy grid attached to a glass microscope slide, and a light‐collecting optical fibre and photodiode underneath the specimen. By scanning the laser spot from a reflective to a transmitting part of the grid, a beam profile in the form of an error function can be obtained and by repeating this with the knife edge at different axial positions relative to the beam waist, the divergence and astigmatism of the postobjective laser beam can be obtained. The measured divergence can be used to quantify how much of the full numerical aperture of the lens is used in practice. We present data of the beam radius, beam divergence, ellipticity and astigmatism obtained with low (0.15, 0.7) and high (1.3) numerical aperture lenses and lasers commonly used in confocal and multiphoton laser scanning microscopy. Our knife‐edge method has several advantages over alternative knife‐edge methods used in microscopy including that the knife edge is easy to prepare, that the beam can be characterized also directly under a cover slip, as necessary to reduce spherical aberrations for objectives designed to be used with a cover slip, and it is suitable for use with commercial laser scanning microscopes where access to the laser beam can be limited.
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spelling pubmed-49757162016-08-23 A simple but precise method for quantitative measurement of the quality of the laser focus in a scanning optical microscope TRÄGÅRDH, J. MACRAE, K. TRAVIS, C. AMOR, R. NORRIS, G. WILSON, S.H. OPPO, G.‐L. MCCONNELL, G. J Microsc Original Articles We report a method for characterizing the focussing laser beam exiting the objective in a laser scanning microscope. This method provides the size of the optical focus, the divergence of the beam, the ellipticity and the astigmatism. We use a microscopic‐scale knife edge in the form of a simple transmission electron microscopy grid attached to a glass microscope slide, and a light‐collecting optical fibre and photodiode underneath the specimen. By scanning the laser spot from a reflective to a transmitting part of the grid, a beam profile in the form of an error function can be obtained and by repeating this with the knife edge at different axial positions relative to the beam waist, the divergence and astigmatism of the postobjective laser beam can be obtained. The measured divergence can be used to quantify how much of the full numerical aperture of the lens is used in practice. We present data of the beam radius, beam divergence, ellipticity and astigmatism obtained with low (0.15, 0.7) and high (1.3) numerical aperture lenses and lasers commonly used in confocal and multiphoton laser scanning microscopy. Our knife‐edge method has several advantages over alternative knife‐edge methods used in microscopy including that the knife edge is easy to prepare, that the beam can be characterized also directly under a cover slip, as necessary to reduce spherical aberrations for objectives designed to be used with a cover slip, and it is suitable for use with commercial laser scanning microscopes where access to the laser beam can be limited. John Wiley and Sons Inc. 2015-04-10 2015-07 /pmc/articles/PMC4975716/ /pubmed/25864964 http://dx.doi.org/10.1111/jmi.12249 Text en © 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society This is an open access article under the terms of the Creative Commons Attribution (http://creativecommons.org/licenses/by/4.0/) License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.
spellingShingle Original Articles
TRÄGÅRDH, J.
MACRAE, K.
TRAVIS, C.
AMOR, R.
NORRIS, G.
WILSON, S.H.
OPPO, G.‐L.
MCCONNELL, G.
A simple but precise method for quantitative measurement of the quality of the laser focus in a scanning optical microscope
title A simple but precise method for quantitative measurement of the quality of the laser focus in a scanning optical microscope
title_full A simple but precise method for quantitative measurement of the quality of the laser focus in a scanning optical microscope
title_fullStr A simple but precise method for quantitative measurement of the quality of the laser focus in a scanning optical microscope
title_full_unstemmed A simple but precise method for quantitative measurement of the quality of the laser focus in a scanning optical microscope
title_short A simple but precise method for quantitative measurement of the quality of the laser focus in a scanning optical microscope
title_sort simple but precise method for quantitative measurement of the quality of the laser focus in a scanning optical microscope
topic Original Articles
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4975716/
https://www.ncbi.nlm.nih.gov/pubmed/25864964
http://dx.doi.org/10.1111/jmi.12249
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