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Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers

[Image: see text] Self-assembled monolayers (SAMs) containing embedded dipolar groups offer the particular advantage of changing the electronic properties of a surface without affecting the SAM–ambient interface. Here we show that such systems can also be used for continuously tuning metal work func...

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Autores principales: Hehn, Iris, Schuster, Swen, Wächter, Tobias, Abu-Husein, Tarek, Terfort, Andreas, Zharnikov, Michael, Zojer, Egbert
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2016
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4976398/
https://www.ncbi.nlm.nih.gov/pubmed/27429041
http://dx.doi.org/10.1021/acs.jpclett.6b01096
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author Hehn, Iris
Schuster, Swen
Wächter, Tobias
Abu-Husein, Tarek
Terfort, Andreas
Zharnikov, Michael
Zojer, Egbert
author_facet Hehn, Iris
Schuster, Swen
Wächter, Tobias
Abu-Husein, Tarek
Terfort, Andreas
Zharnikov, Michael
Zojer, Egbert
author_sort Hehn, Iris
collection PubMed
description [Image: see text] Self-assembled monolayers (SAMs) containing embedded dipolar groups offer the particular advantage of changing the electronic properties of a surface without affecting the SAM–ambient interface. Here we show that such systems can also be used for continuously tuning metal work functions by growing mixed monolayers consisting of molecules with different orientations of the embedded dipolar groups. To avoid injection hot-spots when using the SAM-modified electrodes in devices, a homogeneous mixing of the two components is crucial. We show that a combination of high-resolution X-ray photoelectron spectroscopy with state-of-the-art simulations is an ideal tool for probing the electrostatic homogeneity of the layers and thus for determining phase separation processes in polar adsorbate assemblies down to inhomogeneities at the molecular level.
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spelling pubmed-49763982016-08-10 Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers Hehn, Iris Schuster, Swen Wächter, Tobias Abu-Husein, Tarek Terfort, Andreas Zharnikov, Michael Zojer, Egbert J Phys Chem Lett [Image: see text] Self-assembled monolayers (SAMs) containing embedded dipolar groups offer the particular advantage of changing the electronic properties of a surface without affecting the SAM–ambient interface. Here we show that such systems can also be used for continuously tuning metal work functions by growing mixed monolayers consisting of molecules with different orientations of the embedded dipolar groups. To avoid injection hot-spots when using the SAM-modified electrodes in devices, a homogeneous mixing of the two components is crucial. We show that a combination of high-resolution X-ray photoelectron spectroscopy with state-of-the-art simulations is an ideal tool for probing the electrostatic homogeneity of the layers and thus for determining phase separation processes in polar adsorbate assemblies down to inhomogeneities at the molecular level. American Chemical Society 2016-07-18 2016-08-04 /pmc/articles/PMC4976398/ /pubmed/27429041 http://dx.doi.org/10.1021/acs.jpclett.6b01096 Text en Copyright © 2016 American Chemical Society This is an open access article published under a Creative Commons Attribution (CC-BY) License (http://pubs.acs.org/page/policy/authorchoice_ccby_termsofuse.html) , which permits unrestricted use, distribution and reproduction in any medium, provided the author and source are cited.
spellingShingle Hehn, Iris
Schuster, Swen
Wächter, Tobias
Abu-Husein, Tarek
Terfort, Andreas
Zharnikov, Michael
Zojer, Egbert
Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers
title Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers
title_full Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers
title_fullStr Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers
title_full_unstemmed Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers
title_short Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers
title_sort employing x-ray photoelectron spectroscopy for determining layer homogeneity in mixed polar self-assembled monolayers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4976398/
https://www.ncbi.nlm.nih.gov/pubmed/27429041
http://dx.doi.org/10.1021/acs.jpclett.6b01096
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