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Advanced atomic force microscopy techniques III

Detalles Bibliográficos
Autores principales: Glatzel, Thilo, Schimmel, Thomas
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4979673/
https://www.ncbi.nlm.nih.gov/pubmed/27547623
http://dx.doi.org/10.3762/bjnano.7.98
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author Glatzel, Thilo
Schimmel, Thomas
author_facet Glatzel, Thilo
Schimmel, Thomas
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spelling pubmed-49796732016-08-19 Advanced atomic force microscopy techniques III Glatzel, Thilo Schimmel, Thomas Beilstein J Nanotechnol Editorial Beilstein-Institut 2016-07-21 /pmc/articles/PMC4979673/ /pubmed/27547623 http://dx.doi.org/10.3762/bjnano.7.98 Text en Copyright © 2016, Glatzel and Schimmel https://creativecommons.org/licenses/by/2.0https://www.beilstein-journals.org/bjnano/termsThis is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (https://www.beilstein-journals.org/bjnano/terms)
spellingShingle Editorial
Glatzel, Thilo
Schimmel, Thomas
Advanced atomic force microscopy techniques III
title Advanced atomic force microscopy techniques III
title_full Advanced atomic force microscopy techniques III
title_fullStr Advanced atomic force microscopy techniques III
title_full_unstemmed Advanced atomic force microscopy techniques III
title_short Advanced atomic force microscopy techniques III
title_sort advanced atomic force microscopy techniques iii
topic Editorial
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4979673/
https://www.ncbi.nlm.nih.gov/pubmed/27547623
http://dx.doi.org/10.3762/bjnano.7.98
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