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Modelling of ‘sub-atomic’ contrast resulting from back-bonding on Si(111)-7×7
It has recently been shown that ‘sub-atomic’ contrast can be observed during NC-AFM imaging of the Si(111)-7×7 substrate with a passivated tip, resulting in triangular shaped atoms [Sweetman et al. Nano Lett. 2014, 14, 2265]. The symmetry of the features, and the well-established nature of the dangl...
Autores principales: | Sweetman, Adam, Jarvis, Samuel P, Rashid, Mohammad A |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Beilstein-Institut
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4979881/ https://www.ncbi.nlm.nih.gov/pubmed/27547610 http://dx.doi.org/10.3762/bjnano.7.85 |
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