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Modelling of ‘sub-atomic’ contrast resulting from back-bonding on Si(111)-7×7

It has recently been shown that ‘sub-atomic’ contrast can be observed during NC-AFM imaging of the Si(111)-7×7 substrate with a passivated tip, resulting in triangular shaped atoms [Sweetman et al. Nano Lett. 2014, 14, 2265]. The symmetry of the features, and the well-established nature of the dangl...

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Detalles Bibliográficos
Autores principales: Sweetman, Adam, Jarvis, Samuel P, Rashid, Mohammad A
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4979881/
https://www.ncbi.nlm.nih.gov/pubmed/27547610
http://dx.doi.org/10.3762/bjnano.7.85

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