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Microstructure evolution with varied layer thickness in magnetron-sputtered Ni/C multilayer films
The microstructure evolution of magnetron-sputtered Ni/C multilayers was investigated by varying the Ni and C layer thickness in the region of a few nanometers. For the samples having 2.6-nm-thick C layers, the interface width increases from 0.37 to 0.81 nm as the Ni layer thickness decreases from 4...
Autores principales: | Peng, Jichang, Li, Wenbin, Huang, Qiushi, Wang, Zhanshan |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4981846/ https://www.ncbi.nlm.nih.gov/pubmed/27515586 http://dx.doi.org/10.1038/srep31522 |
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