Cargando…

Distinguishing cubic and hexagonal phases within InGaN/GaN microstructures using electron energy loss spectroscopy

3D InGaN/GaN microstructures grown by metal organic vapor phase epitaxy (MOVPE) and molecular beam epitaxy (MBE) have been extensively studied using a range of electron microscopy techniques. The growth of material by MBE has led to the growth of cubic GaN material. The changes in these crystal phas...

Descripción completa

Detalles Bibliográficos
Autores principales: GRIFFITHS, IJ, CHERNS, D, ALBERT, S., BENGOECHEA‐ENCABO, A., ANGEL SANCHEZ, M., CALLEJA, E., SCHIMPKE, T., STRASSBURG, M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2015
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4989450/
https://www.ncbi.nlm.nih.gov/pubmed/26366483
http://dx.doi.org/10.1111/jmi.12285
_version_ 1782448574104076288
author GRIFFITHS, IJ
CHERNS, D
ALBERT, S.
BENGOECHEA‐ENCABO, A.
ANGEL SANCHEZ, M.
CALLEJA, E.
SCHIMPKE, T.
STRASSBURG, M.
author_facet GRIFFITHS, IJ
CHERNS, D
ALBERT, S.
BENGOECHEA‐ENCABO, A.
ANGEL SANCHEZ, M.
CALLEJA, E.
SCHIMPKE, T.
STRASSBURG, M.
author_sort GRIFFITHS, IJ
collection PubMed
description 3D InGaN/GaN microstructures grown by metal organic vapor phase epitaxy (MOVPE) and molecular beam epitaxy (MBE) have been extensively studied using a range of electron microscopy techniques. The growth of material by MBE has led to the growth of cubic GaN material. The changes in these crystal phases has been investigated by Electron Energy Loss Spectroscopy, where the variations in the fine structure of the N K‐edge shows a clear difference allowing the mapping of the phases to take place. GaN layers grown for light emitting devices sometimes have cubic inclusions in the normally hexagonal wurtzite structures, which can influence the device electronic properties. Differences in the fine structure of the N K‐edge between cubic and hexagonal material in electron energy loss spectra are used to map cubic and hexagonal regions in a GaN/InGaN microcolumnar device. The method of mapping is explained, and the factors limiting spatial resolution are discussed.
format Online
Article
Text
id pubmed-4989450
institution National Center for Biotechnology Information
language English
publishDate 2015
publisher John Wiley and Sons Inc.
record_format MEDLINE/PubMed
spelling pubmed-49894502016-09-01 Distinguishing cubic and hexagonal phases within InGaN/GaN microstructures using electron energy loss spectroscopy GRIFFITHS, IJ CHERNS, D ALBERT, S. BENGOECHEA‐ENCABO, A. ANGEL SANCHEZ, M. CALLEJA, E. SCHIMPKE, T. STRASSBURG, M. J Microsc Themed Issue Papers 3D InGaN/GaN microstructures grown by metal organic vapor phase epitaxy (MOVPE) and molecular beam epitaxy (MBE) have been extensively studied using a range of electron microscopy techniques. The growth of material by MBE has led to the growth of cubic GaN material. The changes in these crystal phases has been investigated by Electron Energy Loss Spectroscopy, where the variations in the fine structure of the N K‐edge shows a clear difference allowing the mapping of the phases to take place. GaN layers grown for light emitting devices sometimes have cubic inclusions in the normally hexagonal wurtzite structures, which can influence the device electronic properties. Differences in the fine structure of the N K‐edge between cubic and hexagonal material in electron energy loss spectra are used to map cubic and hexagonal regions in a GaN/InGaN microcolumnar device. The method of mapping is explained, and the factors limiting spatial resolution are discussed. John Wiley and Sons Inc. 2015-09-14 2016-05 /pmc/articles/PMC4989450/ /pubmed/26366483 http://dx.doi.org/10.1111/jmi.12285 Text en © 2015 The Authors. Journal of Microscopy published by John Wiley & Sons. Ltd on behalf of Royal Microscopical Society. This is an open access article under the terms of the Creative Commons Attribution (http://creativecommons.org/licenses/by/4.0/) License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.
spellingShingle Themed Issue Papers
GRIFFITHS, IJ
CHERNS, D
ALBERT, S.
BENGOECHEA‐ENCABO, A.
ANGEL SANCHEZ, M.
CALLEJA, E.
SCHIMPKE, T.
STRASSBURG, M.
Distinguishing cubic and hexagonal phases within InGaN/GaN microstructures using electron energy loss spectroscopy
title Distinguishing cubic and hexagonal phases within InGaN/GaN microstructures using electron energy loss spectroscopy
title_full Distinguishing cubic and hexagonal phases within InGaN/GaN microstructures using electron energy loss spectroscopy
title_fullStr Distinguishing cubic and hexagonal phases within InGaN/GaN microstructures using electron energy loss spectroscopy
title_full_unstemmed Distinguishing cubic and hexagonal phases within InGaN/GaN microstructures using electron energy loss spectroscopy
title_short Distinguishing cubic and hexagonal phases within InGaN/GaN microstructures using electron energy loss spectroscopy
title_sort distinguishing cubic and hexagonal phases within ingan/gan microstructures using electron energy loss spectroscopy
topic Themed Issue Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4989450/
https://www.ncbi.nlm.nih.gov/pubmed/26366483
http://dx.doi.org/10.1111/jmi.12285
work_keys_str_mv AT griffithsij distinguishingcubicandhexagonalphaseswithininganganmicrostructuresusingelectronenergylossspectroscopy
AT chernsd distinguishingcubicandhexagonalphaseswithininganganmicrostructuresusingelectronenergylossspectroscopy
AT alberts distinguishingcubicandhexagonalphaseswithininganganmicrostructuresusingelectronenergylossspectroscopy
AT bengoecheaencaboa distinguishingcubicandhexagonalphaseswithininganganmicrostructuresusingelectronenergylossspectroscopy
AT angelsanchezm distinguishingcubicandhexagonalphaseswithininganganmicrostructuresusingelectronenergylossspectroscopy
AT callejae distinguishingcubicandhexagonalphaseswithininganganmicrostructuresusingelectronenergylossspectroscopy
AT schimpket distinguishingcubicandhexagonalphaseswithininganganmicrostructuresusingelectronenergylossspectroscopy
AT strassburgm distinguishingcubicandhexagonalphaseswithininganganmicrostructuresusingelectronenergylossspectroscopy