Development of a speckle-based portable device for in situ metrology of synchrotron X-ray mirrors

A portable device for in situ metrology of synchrotron X-ray mirrors based on the near-field speckle scanning technique has been developed. Ultra-high angular sensitivity is achieved by scanning a piece of abrasive paper or filter membrane in the X-ray beam. In addition to the compact setup and ease...

Descripción completa

Detalles Bibliográficos
Autores principales: Kashyap, Yogesh, Wang, Hongchang, Sawhney, Kawal
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2016
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5006653/
https://www.ncbi.nlm.nih.gov/pubmed/27577767
http://dx.doi.org/10.1107/S1600577516012509
_version_ 1782451107825451008
author Kashyap, Yogesh
Wang, Hongchang
Sawhney, Kawal
author_facet Kashyap, Yogesh
Wang, Hongchang
Sawhney, Kawal
author_sort Kashyap, Yogesh
collection PubMed
description A portable device for in situ metrology of synchrotron X-ray mirrors based on the near-field speckle scanning technique has been developed. Ultra-high angular sensitivity is achieved by scanning a piece of abrasive paper or filter membrane in the X-ray beam. In addition to the compact setup and ease of implementation, a user-friendly graphical user interface has been developed to ensure that optimizing active X-ray mirrors is simple and fast. The functionality and feasibility of this device have been demonstrated by characterizing and optimizing X-ray mirrors.
format Online
Article
Text
id pubmed-5006653
institution National Center for Biotechnology Information
language English
publishDate 2016
publisher International Union of Crystallography
record_format MEDLINE/PubMed
spelling pubmed-50066532016-09-14 Development of a speckle-based portable device for in situ metrology of synchrotron X-ray mirrors Kashyap, Yogesh Wang, Hongchang Sawhney, Kawal J Synchrotron Radiat Research Papers A portable device for in situ metrology of synchrotron X-ray mirrors based on the near-field speckle scanning technique has been developed. Ultra-high angular sensitivity is achieved by scanning a piece of abrasive paper or filter membrane in the X-ray beam. In addition to the compact setup and ease of implementation, a user-friendly graphical user interface has been developed to ensure that optimizing active X-ray mirrors is simple and fast. The functionality and feasibility of this device have been demonstrated by characterizing and optimizing X-ray mirrors. International Union of Crystallography 2016-08-16 /pmc/articles/PMC5006653/ /pubmed/27577767 http://dx.doi.org/10.1107/S1600577516012509 Text en © Yogesh Kashyap et al. 2016 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.
spellingShingle Research Papers
Kashyap, Yogesh
Wang, Hongchang
Sawhney, Kawal
Development of a speckle-based portable device for in situ metrology of synchrotron X-ray mirrors
title Development of a speckle-based portable device for in situ metrology of synchrotron X-ray mirrors
title_full Development of a speckle-based portable device for in situ metrology of synchrotron X-ray mirrors
title_fullStr Development of a speckle-based portable device for in situ metrology of synchrotron X-ray mirrors
title_full_unstemmed Development of a speckle-based portable device for in situ metrology of synchrotron X-ray mirrors
title_short Development of a speckle-based portable device for in situ metrology of synchrotron X-ray mirrors
title_sort development of a speckle-based portable device for in situ metrology of synchrotron x-ray mirrors
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5006653/
https://www.ncbi.nlm.nih.gov/pubmed/27577767
http://dx.doi.org/10.1107/S1600577516012509
work_keys_str_mv AT kashyapyogesh developmentofaspecklebasedportabledeviceforinsitumetrologyofsynchrotronxraymirrors
AT wanghongchang developmentofaspecklebasedportabledeviceforinsitumetrologyofsynchrotronxraymirrors
AT sawhneykawal developmentofaspecklebasedportabledeviceforinsitumetrologyofsynchrotronxraymirrors

Ejemplares similares