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Location and Visualization of Working p-n and/or n-p Junctions by XPS

X-ray photoelectron spectroscopy (XPS) is used to follow some of the electrical properties of a segmented silicon photodetector, fabricated in a p-n-p configuration, during operation under various biasing configurations. Mapping of the binding energy position of Si2p reveals the shift in the positio...

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Detalles Bibliográficos
Autores principales:	Copuroglu, Mehmet, Caliskan, Deniz, Sezen, Hikmet, Ozbay, Ekmel, Suzer, Sefik
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Nature Publishing Group 2016
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5007498/ https://www.ncbi.nlm.nih.gov/pubmed/27582318 http://dx.doi.org/10.1038/srep32482

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