Fundamental aspects of electric double layer force-distance measurements at liquid-solid interfaces using atomic force microscopy

Atomic force microscopy (AFM) force-distance measurements are used to investigate the layered ion structure of Ionic Liquids (ILs) at the mica surface. The effects of various tip properties on the measured force profiles are examined and reveal that the measured ion position is independent of tip pr...

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Detalles Bibliográficos
Autores principales: Black, Jennifer M., Zhu, Mengyang, Zhang, Pengfei, Unocic, Raymond R., Guo, Daqiang, Okatan, M. Baris, Dai, Sheng, Cummings, Peter T., Kalinin, Sergei V., Feng, Guang, Balke, Nina
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5009352/
https://www.ncbi.nlm.nih.gov/pubmed/27587276
http://dx.doi.org/10.1038/srep32389

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5009352/
https://www.ncbi.nlm.nih.gov/pubmed/27587276
http://dx.doi.org/10.1038/srep32389

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