Detection of Lesions Underlying Intractable Epilepsy on T1-Weighted MRI as an Outlier Detection Problem

Pattern recognition methods, such as computer aided diagnosis (CAD) systems, can help clinicians in their diagnosis by marking abnormal regions in an image. We propose a machine learning system based on a one-class support vector machine (OC-SVM) classifier for the detection of abnormalities in magn...

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Detalles Bibliográficos
Autores principales: El Azami, Meriem, Hammers, Alexander, Jung, Julien, Costes, Nicolas, Bouet, Romain, Lartizien, Carole
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Public Library of Science 2016
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5015774/
https://www.ncbi.nlm.nih.gov/pubmed/27603778
http://dx.doi.org/10.1371/journal.pone.0161498

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5015774/
https://www.ncbi.nlm.nih.gov/pubmed/27603778
http://dx.doi.org/10.1371/journal.pone.0161498

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