High Sensitivity Refractometer Based on TiO(2)-Coated Adiabatic Tapered Optical Fiber via ALD Technology

Atomic layer deposition (ALD) technology is introduced to fabricate a high sensitivity refractometer based on an adiabatic tapered optical fiber. Different thicknesses of titanium dioxide (TiO(2)) nanofilm were coated around the tapered fiber precisely and uniformly under different deposition cycles...

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Detalles Bibliográficos
Autores principales: Zhu, Shan, Pang, Fufei, Huang, Sujuan, Zou, Fang, Guo, Qiang, Wen, Jianxiang, Wang, Tingyun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5017460/
https://www.ncbi.nlm.nih.gov/pubmed/27537885
http://dx.doi.org/10.3390/s16081295

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5017460/
https://www.ncbi.nlm.nih.gov/pubmed/27537885
http://dx.doi.org/10.3390/s16081295

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