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High Sensitivity Refractometer Based on TiO(2)-Coated Adiabatic Tapered Optical Fiber via ALD Technology

Atomic layer deposition (ALD) technology is introduced to fabricate a high sensitivity refractometer based on an adiabatic tapered optical fiber. Different thicknesses of titanium dioxide (TiO(2)) nanofilm were coated around the tapered fiber precisely and uniformly under different deposition cycles...

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Detalles Bibliográficos
Autores principales:	Zhu, Shan, Pang, Fufei, Huang, Sujuan, Zou, Fang, Guo, Qiang, Wen, Jianxiang, Wang, Tingyun
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2016
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5017460/ https://www.ncbi.nlm.nih.gov/pubmed/27537885 http://dx.doi.org/10.3390/s16081295

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