Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images

Serial block-face scanning electron microscopy (SBEM) is quickly becoming an important imaging tool to explore three-dimensional biological structure across spatial scales. At probe-beam-electron energies of 2.0 keV or lower, the axial resolution should improve, because there is less primary electro...

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Detalles Bibliográficos
Autores principales: Bouwer, James C., Deerinck, Thomas J., Bushong, Eric, Astakhov, Vadim, Ramachandra, Ranjan, Peltier, Steven T., Ellisman, Mark H.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer International Publishing 2016
Materias:
Research
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5025511/
https://www.ncbi.nlm.nih.gov/pubmed/27695667
http://dx.doi.org/10.1186/s40679-016-0025-y

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5025511/
https://www.ncbi.nlm.nih.gov/pubmed/27695667
http://dx.doi.org/10.1186/s40679-016-0025-y

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