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High speed e-beam writing for large area photonic nanostructures — a choice of parameters
Photonic nanostructures are used for many optical systems and applications. However, some high-end applications require the use of electron-beam lithography (EBL) to generate such nanostructures. An important technological bottleneck is the exposure time of the EBL systems, which can exceed 24 hours...
Autores principales: | , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5025733/ https://www.ncbi.nlm.nih.gov/pubmed/27633902 http://dx.doi.org/10.1038/srep32945 |
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author | Li, Kezheng Li, Juntao Reardon, Christopher Schuster, Christian S. Wang, Yue Triggs, Graham J. Damnik, Niklas Müenchenberger, Jana Wang, Xuehua Martins, Emiliano R. Krauss, Thomas F. |
author_facet | Li, Kezheng Li, Juntao Reardon, Christopher Schuster, Christian S. Wang, Yue Triggs, Graham J. Damnik, Niklas Müenchenberger, Jana Wang, Xuehua Martins, Emiliano R. Krauss, Thomas F. |
author_sort | Li, Kezheng |
collection | PubMed |
description | Photonic nanostructures are used for many optical systems and applications. However, some high-end applications require the use of electron-beam lithography (EBL) to generate such nanostructures. An important technological bottleneck is the exposure time of the EBL systems, which can exceed 24 hours per 1 cm(2). Here, we have developed a method based on a target function to systematically increase the writing speed of EBL. As an example, we use as the target function the fidelity of the Fourier Transform spectra of nanostructures that are designed for thin film light trapping applications, and optimize the full parameter space of the lithography process. Finally, we are able to reduce the exposure time by a factor of 5.5 without loss of photonic performance. We show that the performances of the fastest written structures are identical to the original ones within experimental error. As the target function can be varied according to different purposes, the method is also applicable to guided mode resonant grating and many other areas. These findings contribute to the advancement of EBL and point towards making the technology more attractive for commercial applications. |
format | Online Article Text |
id | pubmed-5025733 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2016 |
publisher | Nature Publishing Group |
record_format | MEDLINE/PubMed |
spelling | pubmed-50257332016-09-22 High speed e-beam writing for large area photonic nanostructures — a choice of parameters Li, Kezheng Li, Juntao Reardon, Christopher Schuster, Christian S. Wang, Yue Triggs, Graham J. Damnik, Niklas Müenchenberger, Jana Wang, Xuehua Martins, Emiliano R. Krauss, Thomas F. Sci Rep Article Photonic nanostructures are used for many optical systems and applications. However, some high-end applications require the use of electron-beam lithography (EBL) to generate such nanostructures. An important technological bottleneck is the exposure time of the EBL systems, which can exceed 24 hours per 1 cm(2). Here, we have developed a method based on a target function to systematically increase the writing speed of EBL. As an example, we use as the target function the fidelity of the Fourier Transform spectra of nanostructures that are designed for thin film light trapping applications, and optimize the full parameter space of the lithography process. Finally, we are able to reduce the exposure time by a factor of 5.5 without loss of photonic performance. We show that the performances of the fastest written structures are identical to the original ones within experimental error. As the target function can be varied according to different purposes, the method is also applicable to guided mode resonant grating and many other areas. These findings contribute to the advancement of EBL and point towards making the technology more attractive for commercial applications. Nature Publishing Group 2016-09-16 /pmc/articles/PMC5025733/ /pubmed/27633902 http://dx.doi.org/10.1038/srep32945 Text en Copyright © 2016, The Author(s) http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ |
spellingShingle | Article Li, Kezheng Li, Juntao Reardon, Christopher Schuster, Christian S. Wang, Yue Triggs, Graham J. Damnik, Niklas Müenchenberger, Jana Wang, Xuehua Martins, Emiliano R. Krauss, Thomas F. High speed e-beam writing for large area photonic nanostructures — a choice of parameters |
title | High speed e-beam writing for large area photonic nanostructures — a choice of parameters |
title_full | High speed e-beam writing for large area photonic nanostructures — a choice of parameters |
title_fullStr | High speed e-beam writing for large area photonic nanostructures — a choice of parameters |
title_full_unstemmed | High speed e-beam writing for large area photonic nanostructures — a choice of parameters |
title_short | High speed e-beam writing for large area photonic nanostructures — a choice of parameters |
title_sort | high speed e-beam writing for large area photonic nanostructures — a choice of parameters |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5025733/ https://www.ncbi.nlm.nih.gov/pubmed/27633902 http://dx.doi.org/10.1038/srep32945 |
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