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Resolution criteria in double-slit microscopic imaging experiments

Double-slit imaging is widely used for verifying the resolution of high-resolution and super-resolution microscopies. However, due to the fabrication limits, the slit width is generally non-negligible, which can affect the claimed resolution. In this paper we theoretically calculate the electromagne...

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Detalles Bibliográficos
Autores principales: You, Shangting, Kuang, Cuifang, Zhang, Baile
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5027385/
https://www.ncbi.nlm.nih.gov/pubmed/27640808
http://dx.doi.org/10.1038/srep33764