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Bound exciton and free exciton states in GaSe thin slab

The photoluminescence (PL) and absorption experiments have been performed in GaSe slab with incident light polarized perpendicular to c-axis of sample at 10 K. An obvious energy difference of about 34 meV between exciton absorption peak and PL peak (the highest energy peak) is observed. By studying...

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Autores principales: Wei, Chengrong, Chen, Xi, Li, Dian, Su, Huimin, He, Hongtao, Dai, Jun-Feng
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5032168/
https://www.ncbi.nlm.nih.gov/pubmed/27654064
http://dx.doi.org/10.1038/srep33890
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author Wei, Chengrong
Chen, Xi
Li, Dian
Su, Huimin
He, Hongtao
Dai, Jun-Feng
author_facet Wei, Chengrong
Chen, Xi
Li, Dian
Su, Huimin
He, Hongtao
Dai, Jun-Feng
author_sort Wei, Chengrong
collection PubMed
description The photoluminescence (PL) and absorption experiments have been performed in GaSe slab with incident light polarized perpendicular to c-axis of sample at 10 K. An obvious energy difference of about 34 meV between exciton absorption peak and PL peak (the highest energy peak) is observed. By studying the temperature dependence of PL and absorption spectra, we attribute it to energy difference between free exciton and bound exciton states, where main exciton absorption peak comes from free exciton absorption, and PL peak is attributed to recombination of bound exciton at 10 K. This strong bound exciton effect is stable up to 50 K. Moreover, the temperature dependence of integrated PL intensity and PL lifetime reveals that a non-radiative process, with activation energy extracted as 0.5 meV, dominates PL emission.
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spelling pubmed-50321682016-09-29 Bound exciton and free exciton states in GaSe thin slab Wei, Chengrong Chen, Xi Li, Dian Su, Huimin He, Hongtao Dai, Jun-Feng Sci Rep Article The photoluminescence (PL) and absorption experiments have been performed in GaSe slab with incident light polarized perpendicular to c-axis of sample at 10 K. An obvious energy difference of about 34 meV between exciton absorption peak and PL peak (the highest energy peak) is observed. By studying the temperature dependence of PL and absorption spectra, we attribute it to energy difference between free exciton and bound exciton states, where main exciton absorption peak comes from free exciton absorption, and PL peak is attributed to recombination of bound exciton at 10 K. This strong bound exciton effect is stable up to 50 K. Moreover, the temperature dependence of integrated PL intensity and PL lifetime reveals that a non-radiative process, with activation energy extracted as 0.5 meV, dominates PL emission. Nature Publishing Group 2016-09-22 /pmc/articles/PMC5032168/ /pubmed/27654064 http://dx.doi.org/10.1038/srep33890 Text en Copyright © 2016, The Author(s) http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Article
Wei, Chengrong
Chen, Xi
Li, Dian
Su, Huimin
He, Hongtao
Dai, Jun-Feng
Bound exciton and free exciton states in GaSe thin slab
title Bound exciton and free exciton states in GaSe thin slab
title_full Bound exciton and free exciton states in GaSe thin slab
title_fullStr Bound exciton and free exciton states in GaSe thin slab
title_full_unstemmed Bound exciton and free exciton states in GaSe thin slab
title_short Bound exciton and free exciton states in GaSe thin slab
title_sort bound exciton and free exciton states in gase thin slab
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5032168/
https://www.ncbi.nlm.nih.gov/pubmed/27654064
http://dx.doi.org/10.1038/srep33890
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