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Digital Platform for Wafer-Level MEMS Testing and Characterization Using Electrical Response
The uniqueness of microelectromechanical system (MEMS) devices, with their multiphysics characteristics, presents some limitations to the borrowed test methods from traditional integrated circuits (IC) manufacturing. Although some improvements have been performed, this specific area still lags behin...
Autores principales: | Brito, Nuno, Ferreira, Carlos, Alves, Filipe, Cabral, Jorge, Gaspar, João, Monteiro, João, Rocha, Luís |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5038823/ https://www.ncbi.nlm.nih.gov/pubmed/27657087 http://dx.doi.org/10.3390/s16091553 |
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