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Extremely Stable Current Emission of P‐Doped SiC Flexible Field Emitters
Novel P‐doped SiC flexible field emitters are developed on carbon fabric substrates, having both low E (to) of 1.03–0.73 Vμm(−1) up to high temperatures of 673 K, and extremely high current emission stability when subjected to different bending states, bending circle times as well as high temperatur...
Autores principales: | , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
John Wiley and Sons Inc.
2015
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5063129/ https://www.ncbi.nlm.nih.gov/pubmed/27774383 http://dx.doi.org/10.1002/advs.201500256 |
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author | Chen, Shanliang Shang, Minghui Gao, Fengmei Wang, Lin Ying, Pengzhan Yang, Weiyou Fang, Xiaosheng |
author_facet | Chen, Shanliang Shang, Minghui Gao, Fengmei Wang, Lin Ying, Pengzhan Yang, Weiyou Fang, Xiaosheng |
author_sort | Chen, Shanliang |
collection | PubMed |
description | Novel P‐doped SiC flexible field emitters are developed on carbon fabric substrates, having both low E (to) of 1.03–0.73 Vμm(−1) up to high temperatures of 673 K, and extremely high current emission stability when subjected to different bending states, bending circle times as well as high temperatures (current emission fluctuations are typically in the range ±2.1%–3.4%). [Image: see text] |
format | Online Article Text |
id | pubmed-5063129 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2015 |
publisher | John Wiley and Sons Inc. |
record_format | MEDLINE/PubMed |
spelling | pubmed-50631292016-10-19 Extremely Stable Current Emission of P‐Doped SiC Flexible Field Emitters Chen, Shanliang Shang, Minghui Gao, Fengmei Wang, Lin Ying, Pengzhan Yang, Weiyou Fang, Xiaosheng Adv Sci (Weinh) Communications Novel P‐doped SiC flexible field emitters are developed on carbon fabric substrates, having both low E (to) of 1.03–0.73 Vμm(−1) up to high temperatures of 673 K, and extremely high current emission stability when subjected to different bending states, bending circle times as well as high temperatures (current emission fluctuations are typically in the range ±2.1%–3.4%). [Image: see text] John Wiley and Sons Inc. 2015-11-17 /pmc/articles/PMC5063129/ /pubmed/27774383 http://dx.doi.org/10.1002/advs.201500256 Text en © 2015 The Authors. Published by WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim This is an open access article under the terms of the Creative Commons Attribution (http://creativecommons.org/licenses/by/4.0/) License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited. |
spellingShingle | Communications Chen, Shanliang Shang, Minghui Gao, Fengmei Wang, Lin Ying, Pengzhan Yang, Weiyou Fang, Xiaosheng Extremely Stable Current Emission of P‐Doped SiC Flexible Field Emitters |
title | Extremely Stable Current Emission of P‐Doped SiC Flexible Field Emitters |
title_full | Extremely Stable Current Emission of P‐Doped SiC Flexible Field Emitters |
title_fullStr | Extremely Stable Current Emission of P‐Doped SiC Flexible Field Emitters |
title_full_unstemmed | Extremely Stable Current Emission of P‐Doped SiC Flexible Field Emitters |
title_short | Extremely Stable Current Emission of P‐Doped SiC Flexible Field Emitters |
title_sort | extremely stable current emission of p‐doped sic flexible field emitters |
topic | Communications |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5063129/ https://www.ncbi.nlm.nih.gov/pubmed/27774383 http://dx.doi.org/10.1002/advs.201500256 |
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