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Room temperature redox reaction by oxide ion migration at carbon/Gd-doped CeO(2) heterointerface probed by an in situ hard x-ray photoemission and soft x-ray absorption spectroscopies

In situ hard x-ray photoemission spectroscopy (HX-PES) and soft x-ray absorption spectroscopy (SX-XAS) have been employed to investigate a local redox reaction at the carbon/Gd-doped CeO(2) (GDC) thin film heterointerface under applied dc bias. In HX-PES, Ce3d and O1s core levels show a parallel che...

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Autores principales: Tsuchiya, Takashi, Miyoshi, Shogo, Yamashita, Yoshiyuki, Yoshikawa, Hideki, Terabe, Kazuya, Kobayashi, Keisuke, Yamaguchi, Shu
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Taylor & Francis 2013
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5090320/
https://www.ncbi.nlm.nih.gov/pubmed/27877594
http://dx.doi.org/10.1088/1468-6996/14/4/045001
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author Tsuchiya, Takashi
Miyoshi, Shogo
Yamashita, Yoshiyuki
Yoshikawa, Hideki
Terabe, Kazuya
Kobayashi, Keisuke
Yamaguchi, Shu
author_facet Tsuchiya, Takashi
Miyoshi, Shogo
Yamashita, Yoshiyuki
Yoshikawa, Hideki
Terabe, Kazuya
Kobayashi, Keisuke
Yamaguchi, Shu
author_sort Tsuchiya, Takashi
collection PubMed
description In situ hard x-ray photoemission spectroscopy (HX-PES) and soft x-ray absorption spectroscopy (SX-XAS) have been employed to investigate a local redox reaction at the carbon/Gd-doped CeO(2) (GDC) thin film heterointerface under applied dc bias. In HX-PES, Ce3d and O1s core levels show a parallel chemical shift as large as 3.2 eV, corresponding to the redox window where ionic conductivity is predominant. The window width is equal to the energy gap between donor and acceptor levels of the GDC electrolyte. The Ce M-edge SX-XAS spectra also show a considerable increase of Ce(3+) satellite peak intensity, corresponding to electrochemical reduction by oxide ion migration. In addition to the reversible redox reaction, two distinct phenomena by the electrochemical transport of oxide ions are observed as an irreversible reduction of the entire oxide film by O(2) evolution from the GDC film to the gas phase, as well as a vigorous precipitation of oxygen gas at the bottom electrode to lift off the GDC film. These in situ spectroscopic observations describe well the electrochemical polarization behavior of a metal/GDC/metal capacitor-like two-electrode cell at room temperature.
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spelling pubmed-50903202016-11-22 Room temperature redox reaction by oxide ion migration at carbon/Gd-doped CeO(2) heterointerface probed by an in situ hard x-ray photoemission and soft x-ray absorption spectroscopies Tsuchiya, Takashi Miyoshi, Shogo Yamashita, Yoshiyuki Yoshikawa, Hideki Terabe, Kazuya Kobayashi, Keisuke Yamaguchi, Shu Sci Technol Adv Mater Papers In situ hard x-ray photoemission spectroscopy (HX-PES) and soft x-ray absorption spectroscopy (SX-XAS) have been employed to investigate a local redox reaction at the carbon/Gd-doped CeO(2) (GDC) thin film heterointerface under applied dc bias. In HX-PES, Ce3d and O1s core levels show a parallel chemical shift as large as 3.2 eV, corresponding to the redox window where ionic conductivity is predominant. The window width is equal to the energy gap between donor and acceptor levels of the GDC electrolyte. The Ce M-edge SX-XAS spectra also show a considerable increase of Ce(3+) satellite peak intensity, corresponding to electrochemical reduction by oxide ion migration. In addition to the reversible redox reaction, two distinct phenomena by the electrochemical transport of oxide ions are observed as an irreversible reduction of the entire oxide film by O(2) evolution from the GDC film to the gas phase, as well as a vigorous precipitation of oxygen gas at the bottom electrode to lift off the GDC film. These in situ spectroscopic observations describe well the electrochemical polarization behavior of a metal/GDC/metal capacitor-like two-electrode cell at room temperature. Taylor & Francis 2013-07-08 /pmc/articles/PMC5090320/ /pubmed/27877594 http://dx.doi.org/10.1088/1468-6996/14/4/045001 Text en © 2013 National Institute for Materials Science http://creativecommons.org/licenses/by-nc-sa/3.0/ Content from this work may be used under the terms of the Creative Commons Attribution-NonCommercial-ShareAlike 3.0 licence (http://creativecommons.org/licenses/by-nc-sa/3.0) . Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
spellingShingle Papers
Tsuchiya, Takashi
Miyoshi, Shogo
Yamashita, Yoshiyuki
Yoshikawa, Hideki
Terabe, Kazuya
Kobayashi, Keisuke
Yamaguchi, Shu
Room temperature redox reaction by oxide ion migration at carbon/Gd-doped CeO(2) heterointerface probed by an in situ hard x-ray photoemission and soft x-ray absorption spectroscopies
title Room temperature redox reaction by oxide ion migration at carbon/Gd-doped CeO(2) heterointerface probed by an in situ hard x-ray photoemission and soft x-ray absorption spectroscopies
title_full Room temperature redox reaction by oxide ion migration at carbon/Gd-doped CeO(2) heterointerface probed by an in situ hard x-ray photoemission and soft x-ray absorption spectroscopies
title_fullStr Room temperature redox reaction by oxide ion migration at carbon/Gd-doped CeO(2) heterointerface probed by an in situ hard x-ray photoemission and soft x-ray absorption spectroscopies
title_full_unstemmed Room temperature redox reaction by oxide ion migration at carbon/Gd-doped CeO(2) heterointerface probed by an in situ hard x-ray photoemission and soft x-ray absorption spectroscopies
title_short Room temperature redox reaction by oxide ion migration at carbon/Gd-doped CeO(2) heterointerface probed by an in situ hard x-ray photoemission and soft x-ray absorption spectroscopies
title_sort room temperature redox reaction by oxide ion migration at carbon/gd-doped ceo(2) heterointerface probed by an in situ hard x-ray photoemission and soft x-ray absorption spectroscopies
topic Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5090320/
https://www.ncbi.nlm.nih.gov/pubmed/27877594
http://dx.doi.org/10.1088/1468-6996/14/4/045001
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