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A simple method for the quantification of molecular decorations on silica particles
A simple, rapid quantitative approach to determining attachment density on silica nanoparticles has been demonstrated using attenuated total reflectance Fourier transform infrared spectroscopy and verified by thermogravimetric analysis. A very high attachment of approximately 5 attachments per nm(2)...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Taylor & Francis
2014
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5090605/ https://www.ncbi.nlm.nih.gov/pubmed/27877644 http://dx.doi.org/10.1088/1468-6996/15/1/015002 |