Ambience-sensitive optical refraction in ferroelectric nanofilms of NaNbO(3)

Optical index of refraction n is studied by spectroscopic ellipsometry in epitaxial nanofilms of NaNbO(3) with thickness ∼10 nm grown on different single-crystal substrates. The index n in the transparency spectral range (n ≈ 2.1 – 2.2) exhibits a strong sensitivity to atmospheric-pressure gas ambie...

Descripción completa

Detalles Bibliográficos
Autores principales: Tyunina, Marina, Chvostova, Dagmar, Pacherova, Oliva, Kocourek, Tomas, Jelinek, Miroslav, Jastrabik, Lubomir, Dejneka, Alexander
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Taylor & Francis 2014
Materias:
Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5090690/
https://www.ncbi.nlm.nih.gov/pubmed/27877702
http://dx.doi.org/10.1088/1468-6996/15/4/045001

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5090690/
https://www.ncbi.nlm.nih.gov/pubmed/27877702
http://dx.doi.org/10.1088/1468-6996/15/4/045001

Ejemplares similares