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Ambience-sensitive optical refraction in ferroelectric nanofilms of NaNbO(3)
Optical index of refraction n is studied by spectroscopic ellipsometry in epitaxial nanofilms of NaNbO(3) with thickness ∼10 nm grown on different single-crystal substrates. The index n in the transparency spectral range (n ≈ 2.1 – 2.2) exhibits a strong sensitivity to atmospheric-pressure gas ambie...
Autores principales: | Tyunina, Marina, Chvostova, Dagmar, Pacherova, Oliva, Kocourek, Tomas, Jelinek, Miroslav, Jastrabik, Lubomir, Dejneka, Alexander |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Taylor & Francis
2014
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5090690/ https://www.ncbi.nlm.nih.gov/pubmed/27877702 http://dx.doi.org/10.1088/1468-6996/15/4/045001 |
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