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Controlled tip wear on high roughness surfaces yields gradual broadening and rounding of cantilever tips
Tip size in atomic force microscopy (AFM) has a major impact on the resolution of images and on the results of nanoindentation experiments. Tip wear is therefore a key limitation in the application of AFM. Here we show, however, how wear can be turned into an advantage as it allows for directed tip...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group
2016
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5105056/ https://www.ncbi.nlm.nih.gov/pubmed/27833143 http://dx.doi.org/10.1038/srep36972 |