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Materials characterisation by angle-resolved scanning transmission electron microscopy

Solid-state properties such as strain or chemical composition often leave characteristic fingerprints in the angular dependence of electron scattering. Scanning transmission electron microscopy (STEM) is dedicated to probe scattered intensity with atomic resolution, but it drastically lacks angular...

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Detalles Bibliográficos
Autores principales:	Müller-Caspary, Knut, Oppermann, Oliver, Grieb, Tim, Krause, Florian F., Rosenauer, Andreas, Schowalter, Marco, Mehrtens, Thorsten, Beyer, Andreas, Volz, Kerstin, Potapov, Pavel
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Nature Publishing Group 2016
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5111052/ https://www.ncbi.nlm.nih.gov/pubmed/27849001 http://dx.doi.org/10.1038/srep37146

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