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Surface studies of solids using integral X-ray-induced photoemission yield
X-ray induced photoemission yield contains structural information complementary to that provided by X-ray Fresnel reflectivity, which presents an advantage to a wide variety of surface studies if this information is made easily accessible. Photoemission in materials research is commonly acknowledged...
Autores principales: | Stoupin, Stanislav, Zhernenkov, Mikhail, Shi, Bing |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2016
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5118721/ https://www.ncbi.nlm.nih.gov/pubmed/27874041 http://dx.doi.org/10.1038/srep37440 |
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