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Surface studies of solids using integral X-ray-induced photoemission yield

X-ray induced photoemission yield contains structural information complementary to that provided by X-ray Fresnel reflectivity, which presents an advantage to a wide variety of surface studies if this information is made easily accessible. Photoemission in materials research is commonly acknowledged...

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Detalles Bibliográficos
Autores principales: Stoupin, Stanislav, Zhernenkov, Mikhail, Shi, Bing
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5118721/
https://www.ncbi.nlm.nih.gov/pubmed/27874041
http://dx.doi.org/10.1038/srep37440

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