Dynamics of native oxide growth on CdTe and CdZnTe X-ray and gamma-ray detectors

We studied the growth of the surface oxide layer on four different CdTe and CdZnTe X-ray and gamma-ray detector-grade samples using spectroscopic ellipsometry. We observed gradual oxidization of CdTe and CdZnTe after chemical etching in bromine solutions. From X-ray photoelectron spectroscopy measur...

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Detalles Bibliográficos
Autores principales: Zázvorka, Jakub, Franc, Jan, Beran, Lukáš, Moravec, Pavel, Pekárek, Jakub, Veis, Martin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Taylor & Francis 2016
Materias:
Optical, Magnetic and Electronic Device Materials
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5127254/
https://www.ncbi.nlm.nih.gov/pubmed/27933118
http://dx.doi.org/10.1080/14686996.2016.1250105

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5127254/
https://www.ncbi.nlm.nih.gov/pubmed/27933118
http://dx.doi.org/10.1080/14686996.2016.1250105

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