Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy

The development of new materials and devices for flexible electronics depends crucially on the understanding of how strain affects electronic material properties at the nano-scale. Scanning Kelvin-Probe Microscopy (SKPM) is a unique technique for nanoelectronic investigations as it combines non-inva...

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Detalles Bibliográficos
Autores principales: Cramer, Tobias, Travaglini, Lorenzo, Lai, Stefano, Patruno, Luca, de Miranda, Stefano, Bonfiglio, Annalisa, Cosseddu, Piero, Fraboni, Beatrice
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2016
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5133578/
https://www.ncbi.nlm.nih.gov/pubmed/27910889
http://dx.doi.org/10.1038/srep38203

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