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Full-Field Optical Coherence Tomography Using Galvo Filter-Based Wavelength Swept Laser

We report a wavelength swept laser-based full-field optical coherence tomography for measuring the surfaces and thicknesses of refractive and reflective samples. The system consists of a galvo filter–based wavelength swept laser and a simple Michelson interferometer. Combinations of the reflective a...

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Detalles Bibliográficos
Autores principales: Shirazi, Muhammad Faizan, Kim, Pilun, Jeon, Mansik, Kim, Jeehyun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5134592/
https://www.ncbi.nlm.nih.gov/pubmed/27869659
http://dx.doi.org/10.3390/s16111933
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author Shirazi, Muhammad Faizan
Kim, Pilun
Jeon, Mansik
Kim, Jeehyun
author_facet Shirazi, Muhammad Faizan
Kim, Pilun
Jeon, Mansik
Kim, Jeehyun
author_sort Shirazi, Muhammad Faizan
collection PubMed
description We report a wavelength swept laser-based full-field optical coherence tomography for measuring the surfaces and thicknesses of refractive and reflective samples. The system consists of a galvo filter–based wavelength swept laser and a simple Michelson interferometer. Combinations of the reflective and refractive samples are used to demonstrate the performance of the system. By synchronizing the camera with the source, the cross-sectional information of the samples can be seen after each sweep of the swept source. This system can be effective for the thickness measurement of optical thin films as well as for the depth investigation of samples in industrial applications. A resolution target with a glass cover slip and a step height standard target are imaged, showing the cross-sectional and topographical information of the samples.
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spelling pubmed-51345922017-01-03 Full-Field Optical Coherence Tomography Using Galvo Filter-Based Wavelength Swept Laser Shirazi, Muhammad Faizan Kim, Pilun Jeon, Mansik Kim, Jeehyun Sensors (Basel) Article We report a wavelength swept laser-based full-field optical coherence tomography for measuring the surfaces and thicknesses of refractive and reflective samples. The system consists of a galvo filter–based wavelength swept laser and a simple Michelson interferometer. Combinations of the reflective and refractive samples are used to demonstrate the performance of the system. By synchronizing the camera with the source, the cross-sectional information of the samples can be seen after each sweep of the swept source. This system can be effective for the thickness measurement of optical thin films as well as for the depth investigation of samples in industrial applications. A resolution target with a glass cover slip and a step height standard target are imaged, showing the cross-sectional and topographical information of the samples. MDPI 2016-11-17 /pmc/articles/PMC5134592/ /pubmed/27869659 http://dx.doi.org/10.3390/s16111933 Text en © 2016 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC-BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Shirazi, Muhammad Faizan
Kim, Pilun
Jeon, Mansik
Kim, Jeehyun
Full-Field Optical Coherence Tomography Using Galvo Filter-Based Wavelength Swept Laser
title Full-Field Optical Coherence Tomography Using Galvo Filter-Based Wavelength Swept Laser
title_full Full-Field Optical Coherence Tomography Using Galvo Filter-Based Wavelength Swept Laser
title_fullStr Full-Field Optical Coherence Tomography Using Galvo Filter-Based Wavelength Swept Laser
title_full_unstemmed Full-Field Optical Coherence Tomography Using Galvo Filter-Based Wavelength Swept Laser
title_short Full-Field Optical Coherence Tomography Using Galvo Filter-Based Wavelength Swept Laser
title_sort full-field optical coherence tomography using galvo filter-based wavelength swept laser
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5134592/
https://www.ncbi.nlm.nih.gov/pubmed/27869659
http://dx.doi.org/10.3390/s16111933
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