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Multiparameter characterization of subnanometre Cr/Sc multilayers based on complementary measurements
Cr/Sc multilayer systems can be used as near-normal incidence mirrors for the water window spectral range. It is shown that a detailed characterization of these multilayer systems with 400 bilayers of Cr and Sc, each with individual layer thicknesses <1 nm, is attainable by the combination of sev...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2016
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5139997/ https://www.ncbi.nlm.nih.gov/pubmed/27980515 http://dx.doi.org/10.1107/S1600576716015776 |