Cargando…
Radiation Induced Enhancement of Hydrogen Influence on Luminescent Properties of nc-Si/SiO(2) Structures
Using photo-luminescence, infrared spectroscopy, and electron spin resonance technique, the silicon dioxide films with embedded silicon nanocrystals (nc-Si/SiO(2) structures) have been investigated after γ-irradiation with the dose 2 × 10(7) rad and subsequent annealing at 450 °C in hydrogen ambient...
Autores principales: | Lisovskyy, Igor, Voitovych, Mariia, Litovchenko, Volodymyr, Voitovych, Vasyl, Nasieka, Iurii, Bratus, Viktor |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer US
2016
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5143333/ https://www.ncbi.nlm.nih.gov/pubmed/27928783 http://dx.doi.org/10.1186/s11671-016-1744-7 |
Ejemplares similares
-
Formation of Nanocomposites by Oxidizing Annealing of SiO(x) and SiO(x)<Er,F> Films: Ellipsometry and FTIR Analysis
por: Sopinskyy, Mykola V, et al.
Publicado: (2015) -
Morphological, compositional, structural, and optical properties of Si-nc embedded in SiO(x) films
por: López, J Alberto Luna, et al.
Publicado: (2012) -
Polarization memory effect in the photoluminescence of nc-Si−SiO(x) light-emitting structures
por: Michailovska, Katerina, et al.
Publicado: (2016) -
Compositional and optical properties of SiO(
x
) films and (SiO(
x
)/SiO(
y
)) junctions deposited by HFCVD
por: Vázquez-Valerdi, Diana E, et al.
Publicado: (2014) -
Electrical behavior of MIS devices based on Si nanoclusters embedded in SiO(x)N(y )and SiO(2 )films
por: Jacques, Emmanuel, et al.
Publicado: (2011)