Diffraction Imaging (Topography) with Monochromatic Synchrotron Radiation

Structural information of special interest to crystal growers and device physicists is now available from high resolution monochromatic synchrotron diffraction imaging (topography). In this review, the importance of superior resolution in momentum transfer and in space is described, and illustration...

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Detalles Bibliográficos
Autores principales: Steiner, Bruce, Kuriyama, Masao, Dobbyn, Ronald C., Laor, Uri
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1988
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5178313/
http://dx.doi.org/10.6028/jres.093.151
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author Steiner, Bruce
Kuriyama, Masao
Dobbyn, Ronald C.
Laor, Uri
author_facet Steiner, Bruce
Kuriyama, Masao
Dobbyn, Ronald C.
Laor, Uri
author_sort Steiner, Bruce
collection PubMed
description Structural information of special interest to crystal growers and device physicists is now available from high resolution monochromatic synchrotron diffraction imaging (topography). In this review, the importance of superior resolution in momentum transfer and in space is described, and illustrations are taken from a variety of crystals: gallium arsenide, cadmium telluride, mercuric iodide, bismuth silicon oxide, and lithium niobate. The identification and detailed understanding of local variations in crystal growth processes are shown. Finally, new experimental opportunities now available for exploitation are indicated.
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spelling pubmed-51783132021-08-02 Diffraction Imaging (Topography) with Monochromatic Synchrotron Radiation Steiner, Bruce Kuriyama, Masao Dobbyn, Ronald C. Laor, Uri J Res Natl Bur Stand (1977) Article Structural information of special interest to crystal growers and device physicists is now available from high resolution monochromatic synchrotron diffraction imaging (topography). In this review, the importance of superior resolution in momentum transfer and in space is described, and illustrations are taken from a variety of crystals: gallium arsenide, cadmium telluride, mercuric iodide, bismuth silicon oxide, and lithium niobate. The identification and detailed understanding of local variations in crystal growth processes are shown. Finally, new experimental opportunities now available for exploitation are indicated. [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1988 1988-10-01 /pmc/articles/PMC5178313/ http://dx.doi.org/10.6028/jres.093.151 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Bureau of Standards is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Steiner, Bruce
Kuriyama, Masao
Dobbyn, Ronald C.
Laor, Uri
Diffraction Imaging (Topography) with Monochromatic Synchrotron Radiation
title Diffraction Imaging (Topography) with Monochromatic Synchrotron Radiation
title_full Diffraction Imaging (Topography) with Monochromatic Synchrotron Radiation
title_fullStr Diffraction Imaging (Topography) with Monochromatic Synchrotron Radiation
title_full_unstemmed Diffraction Imaging (Topography) with Monochromatic Synchrotron Radiation
title_short Diffraction Imaging (Topography) with Monochromatic Synchrotron Radiation
title_sort diffraction imaging (topography) with monochromatic synchrotron radiation
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5178313/
http://dx.doi.org/10.6028/jres.093.151
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AT laoruri diffractionimagingtopographywithmonochromaticsynchrotronradiation

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