Diffraction Imaging (Topography) with Monochromatic Synchrotron Radiation

Structural information of special interest to crystal growers and device physicists is now available from high resolution monochromatic synchrotron diffraction imaging (topography). In this review, the importance of superior resolution in momentum transfer and in space is described, and illustration...

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Detalles Bibliográficos
Autores principales: Steiner, Bruce, Kuriyama, Masao, Dobbyn, Ronald C., Laor, Uri
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1988
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5178313/
http://dx.doi.org/10.6028/jres.093.151

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