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Analysis at the Atomic Level: The Atom Probe Field-Ion Microscope
Autor principal: | Miller, M. K. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1988
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5181926/ http://dx.doi.org/10.6028/jres.093.083 |
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