Cargando…
Analytical Chemistry and Material Purity in the Semiconductor Industry
Autor principal: | Seegopaul, Purneshwar |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1988
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5181934/ http://dx.doi.org/10.6028/jres.093.091 |
Ejemplares similares
-
Characterization of High Purity Silicides
por: Seegopaul, Purneshwar, et al.
Publicado: (1988) -
Nanoscale Ion-Exchange Materials: From Analytical Chemistry to Industrial and Biomedical Applications
por: Matczuk, Magdalena, et al.
Publicado: (2023) -
Semiconductor Quantum Dots as Target Analytes: Properties, Surface Chemistry and Detection
por: Sanmartín-Matalobos, Jesús, et al.
Publicado: (2022) -
Facile Analytical Methods to Determine the Purity of Titanium Tetrachloride
por: Lim, Dongwook, et al.
Publicado: (2018) -
Porous Organic Frameworks: Advanced Materials in Analytical Chemistry
por: Zhang, Shuaihua, et al.
Publicado: (2018)