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Multitechnique Approach to Trace Characterization of High Purity Materials: Gallium

Detalles Bibliográficos
Autores principales: Gangadharan, S., Natarajan, S., Arunachalam, J., Jaikumar, S., Burangey, S. V.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1988
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5181936/
http://dx.doi.org/10.6028/jres.093.093
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author Gangadharan, S.
Natarajan, S.
Arunachalam, J.
Jaikumar, S.
Burangey, S. V.
author_facet Gangadharan, S.
Natarajan, S.
Arunachalam, J.
Jaikumar, S.
Burangey, S. V.
author_sort Gangadharan, S.
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spelling pubmed-51819362021-08-02 Multitechnique Approach to Trace Characterization of High Purity Materials: Gallium Gangadharan, S. Natarajan, S. Arunachalam, J. Jaikumar, S. Burangey, S. V. J Res Natl Bur Stand (1977) Article [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1988 1988-06-01 /pmc/articles/PMC5181936/ http://dx.doi.org/10.6028/jres.093.093 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Bureau of Standards is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright.
spellingShingle Article
Gangadharan, S.
Natarajan, S.
Arunachalam, J.
Jaikumar, S.
Burangey, S. V.
Multitechnique Approach to Trace Characterization of High Purity Materials: Gallium
title Multitechnique Approach to Trace Characterization of High Purity Materials: Gallium
title_full Multitechnique Approach to Trace Characterization of High Purity Materials: Gallium
title_fullStr Multitechnique Approach to Trace Characterization of High Purity Materials: Gallium
title_full_unstemmed Multitechnique Approach to Trace Characterization of High Purity Materials: Gallium
title_short Multitechnique Approach to Trace Characterization of High Purity Materials: Gallium
title_sort multitechnique approach to trace characterization of high purity materials: gallium
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5181936/
http://dx.doi.org/10.6028/jres.093.093
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