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Multitechnique Approach to Trace Characterization of High Purity Materials: Gallium
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1988
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5181936/ http://dx.doi.org/10.6028/jres.093.093 |
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author | Gangadharan, S. Natarajan, S. Arunachalam, J. Jaikumar, S. Burangey, S. V. |
author_facet | Gangadharan, S. Natarajan, S. Arunachalam, J. Jaikumar, S. Burangey, S. V. |
author_sort | Gangadharan, S. |
collection | PubMed |
description | |
format | Online Article Text |
id | pubmed-5181936 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 1988 |
publisher | [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology |
record_format | MEDLINE/PubMed |
spelling | pubmed-51819362021-08-02 Multitechnique Approach to Trace Characterization of High Purity Materials: Gallium Gangadharan, S. Natarajan, S. Arunachalam, J. Jaikumar, S. Burangey, S. V. J Res Natl Bur Stand (1977) Article [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1988 1988-06-01 /pmc/articles/PMC5181936/ http://dx.doi.org/10.6028/jres.093.093 Text en https://creativecommons.org/publicdomain/zero/1.0/ The Journal of Research of the National Bureau of Standards is a publication of the U.S. Government. The papers are in the public domain and are not subject to copyright in the United States. Articles from J Res may contain photographs or illustrations copyrighted by other commercial organizations or individuals that may not be used without obtaining prior approval from the holder of the copyright. |
spellingShingle | Article Gangadharan, S. Natarajan, S. Arunachalam, J. Jaikumar, S. Burangey, S. V. Multitechnique Approach to Trace Characterization of High Purity Materials: Gallium |
title | Multitechnique Approach to Trace Characterization of High Purity Materials: Gallium |
title_full | Multitechnique Approach to Trace Characterization of High Purity Materials: Gallium |
title_fullStr | Multitechnique Approach to Trace Characterization of High Purity Materials: Gallium |
title_full_unstemmed | Multitechnique Approach to Trace Characterization of High Purity Materials: Gallium |
title_short | Multitechnique Approach to Trace Characterization of High Purity Materials: Gallium |
title_sort | multitechnique approach to trace characterization of high purity materials: gallium |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5181936/ http://dx.doi.org/10.6028/jres.093.093 |
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