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Noise in NC-AFM measurements with significant tip–sample interaction

The frequency shift noise in non-contact atomic force microscopy (NC-AFM) imaging and spectroscopy consists of thermal noise and detection system noise with an additional contribution from amplitude noise if there are significant tip–sample interactions. The total noise power spectral density D(Δ)(f...

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Detalles Bibliográficos
Autores principales:	Lübbe, Jannis, Temmen, Matthias, Rahe, Philipp, Reichling, Michael
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Beilstein-Institut 2016
Materias:	Full Research Paper
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5238627/ https://www.ncbi.nlm.nih.gov/pubmed/28144538 http://dx.doi.org/10.3762/bjnano.7.181

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