Morphology of SiO(2) films as a key factor in alignment of liquid crystals with negative dielectric anisotropy

Control of liquid crystal (LC) orientation using a proper SiO(2) alignment layer is essential for the optimization of vertically aligned nematic (VAN) displays. With this aim, we studied the optical anisotropy of thin SiO(2) films by generalized ellipsometry as a function of deposition angle. The co...

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Detalles Bibliográficos
Autores principales: Tkachenko, Volodymyr, Marino, Antigone, Otón, Eva, Bennis, Noureddine, Otón, Josè Manuel
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2016
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5238683/
https://www.ncbi.nlm.nih.gov/pubmed/28144524
http://dx.doi.org/10.3762/bjnano.7.167
Descripción
Sumario:Control of liquid crystal (LC) orientation using a proper SiO(2) alignment layer is essential for the optimization of vertically aligned nematic (VAN) displays. With this aim, we studied the optical anisotropy of thin SiO(2) films by generalized ellipsometry as a function of deposition angle. The columnar SiO(2) structure orientation measured by a noninvasive ellipsometry technique is reported for the first time, and its morphology influence on the LC alignment is demonstrated for large deposition angles.

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