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Morphology of SiO(2) films as a key factor in alignment of liquid crystals with negative dielectric anisotropy

Control of liquid crystal (LC) orientation using a proper SiO(2) alignment layer is essential for the optimization of vertically aligned nematic (VAN) displays. With this aim, we studied the optical anisotropy of thin SiO(2) films by generalized ellipsometry as a function of deposition angle. The co...

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Detalles Bibliográficos
Autores principales: Tkachenko, Volodymyr, Marino, Antigone, Otón, Eva, Bennis, Noureddine, Otón, Josè Manuel
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2016
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5238683/
https://www.ncbi.nlm.nih.gov/pubmed/28144524
http://dx.doi.org/10.3762/bjnano.7.167
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author Tkachenko, Volodymyr
Marino, Antigone
Otón, Eva
Bennis, Noureddine
Otón, Josè Manuel
author_facet Tkachenko, Volodymyr
Marino, Antigone
Otón, Eva
Bennis, Noureddine
Otón, Josè Manuel
author_sort Tkachenko, Volodymyr
collection PubMed
description Control of liquid crystal (LC) orientation using a proper SiO(2) alignment layer is essential for the optimization of vertically aligned nematic (VAN) displays. With this aim, we studied the optical anisotropy of thin SiO(2) films by generalized ellipsometry as a function of deposition angle. The columnar SiO(2) structure orientation measured by a noninvasive ellipsometry technique is reported for the first time, and its morphology influence on the LC alignment is demonstrated for large deposition angles.
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spelling pubmed-52386832017-01-31 Morphology of SiO(2) films as a key factor in alignment of liquid crystals with negative dielectric anisotropy Tkachenko, Volodymyr Marino, Antigone Otón, Eva Bennis, Noureddine Otón, Josè Manuel Beilstein J Nanotechnol Full Research Paper Control of liquid crystal (LC) orientation using a proper SiO(2) alignment layer is essential for the optimization of vertically aligned nematic (VAN) displays. With this aim, we studied the optical anisotropy of thin SiO(2) films by generalized ellipsometry as a function of deposition angle. The columnar SiO(2) structure orientation measured by a noninvasive ellipsometry technique is reported for the first time, and its morphology influence on the LC alignment is demonstrated for large deposition angles. Beilstein-Institut 2016-11-17 /pmc/articles/PMC5238683/ /pubmed/28144524 http://dx.doi.org/10.3762/bjnano.7.167 Text en Copyright © 2016, Tkachenko et al. https://creativecommons.org/licenses/by/4.0https://www.beilstein-journals.org/bjnano/termsThis is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (https://www.beilstein-journals.org/bjnano/terms)
spellingShingle Full Research Paper
Tkachenko, Volodymyr
Marino, Antigone
Otón, Eva
Bennis, Noureddine
Otón, Josè Manuel
Morphology of SiO(2) films as a key factor in alignment of liquid crystals with negative dielectric anisotropy
title Morphology of SiO(2) films as a key factor in alignment of liquid crystals with negative dielectric anisotropy
title_full Morphology of SiO(2) films as a key factor in alignment of liquid crystals with negative dielectric anisotropy
title_fullStr Morphology of SiO(2) films as a key factor in alignment of liquid crystals with negative dielectric anisotropy
title_full_unstemmed Morphology of SiO(2) films as a key factor in alignment of liquid crystals with negative dielectric anisotropy
title_short Morphology of SiO(2) films as a key factor in alignment of liquid crystals with negative dielectric anisotropy
title_sort morphology of sio(2) films as a key factor in alignment of liquid crystals with negative dielectric anisotropy
topic Full Research Paper
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5238683/
https://www.ncbi.nlm.nih.gov/pubmed/28144524
http://dx.doi.org/10.3762/bjnano.7.167
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