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Morphology of SiO(2) films as a key factor in alignment of liquid crystals with negative dielectric anisotropy
Control of liquid crystal (LC) orientation using a proper SiO(2) alignment layer is essential for the optimization of vertically aligned nematic (VAN) displays. With this aim, we studied the optical anisotropy of thin SiO(2) films by generalized ellipsometry as a function of deposition angle. The co...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Beilstein-Institut
2016
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5238683/ https://www.ncbi.nlm.nih.gov/pubmed/28144524 http://dx.doi.org/10.3762/bjnano.7.167 |