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Enhancing dielectric permittivity for energy-storage devices through tricritical phenomenon
Although dielectric energy-storing devices are frequently used in high voltage level, the fast growing on the portable and wearable electronics have been increasing the demand on the energy-storing devices at finite electric field strength. This paper proposes an approach on enhancing energy density...
Autores principales: | , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5241884/ https://www.ncbi.nlm.nih.gov/pubmed/28098249 http://dx.doi.org/10.1038/srep40916 |
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author | Gao, Jinghui Wang, Yan Liu, Yongbin Hu, Xinghao Ke, Xiaoqin Zhong, Lisheng He, Yuting Ren, Xiaobing |
author_facet | Gao, Jinghui Wang, Yan Liu, Yongbin Hu, Xinghao Ke, Xiaoqin Zhong, Lisheng He, Yuting Ren, Xiaobing |
author_sort | Gao, Jinghui |
collection | PubMed |
description | Although dielectric energy-storing devices are frequently used in high voltage level, the fast growing on the portable and wearable electronics have been increasing the demand on the energy-storing devices at finite electric field strength. This paper proposes an approach on enhancing energy density under low electric field through compositionally inducing tricriticality in Ba(Ti,Sn)O(3) ferroelectric material system with enlarged dielectric response. The optimal dielectric permittivity at tricritical point can reach to ε(r) = 5.4 × 10(4), and the associated energy density goes to around 30 mJ/cm(3) at the electric field of 10 kV/cm, which exceeds most of the selected ferroelectric materials at the same field strength. The microstructure nature for such a tricritical behavior shows polarization inhomogeneity in nanometeric scale, which indicates a large polarizability under external electric field. Further phenomenological Landau modeling suggests that large dielectric permittivity and energy density can be ascribed to the vanishing of energy barrier for polarization altering caused by tricriticality. Our results may shed light on developing energy-storing dielectrics with large permittivity and energy density at low electric field. |
format | Online Article Text |
id | pubmed-5241884 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2017 |
publisher | Nature Publishing Group |
record_format | MEDLINE/PubMed |
spelling | pubmed-52418842017-01-23 Enhancing dielectric permittivity for energy-storage devices through tricritical phenomenon Gao, Jinghui Wang, Yan Liu, Yongbin Hu, Xinghao Ke, Xiaoqin Zhong, Lisheng He, Yuting Ren, Xiaobing Sci Rep Article Although dielectric energy-storing devices are frequently used in high voltage level, the fast growing on the portable and wearable electronics have been increasing the demand on the energy-storing devices at finite electric field strength. This paper proposes an approach on enhancing energy density under low electric field through compositionally inducing tricriticality in Ba(Ti,Sn)O(3) ferroelectric material system with enlarged dielectric response. The optimal dielectric permittivity at tricritical point can reach to ε(r) = 5.4 × 10(4), and the associated energy density goes to around 30 mJ/cm(3) at the electric field of 10 kV/cm, which exceeds most of the selected ferroelectric materials at the same field strength. The microstructure nature for such a tricritical behavior shows polarization inhomogeneity in nanometeric scale, which indicates a large polarizability under external electric field. Further phenomenological Landau modeling suggests that large dielectric permittivity and energy density can be ascribed to the vanishing of energy barrier for polarization altering caused by tricriticality. Our results may shed light on developing energy-storing dielectrics with large permittivity and energy density at low electric field. Nature Publishing Group 2017-01-18 /pmc/articles/PMC5241884/ /pubmed/28098249 http://dx.doi.org/10.1038/srep40916 Text en Copyright © 2017, The Author(s) http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ |
spellingShingle | Article Gao, Jinghui Wang, Yan Liu, Yongbin Hu, Xinghao Ke, Xiaoqin Zhong, Lisheng He, Yuting Ren, Xiaobing Enhancing dielectric permittivity for energy-storage devices through tricritical phenomenon |
title | Enhancing dielectric permittivity for energy-storage devices through tricritical phenomenon |
title_full | Enhancing dielectric permittivity for energy-storage devices through tricritical phenomenon |
title_fullStr | Enhancing dielectric permittivity for energy-storage devices through tricritical phenomenon |
title_full_unstemmed | Enhancing dielectric permittivity for energy-storage devices through tricritical phenomenon |
title_short | Enhancing dielectric permittivity for energy-storage devices through tricritical phenomenon |
title_sort | enhancing dielectric permittivity for energy-storage devices through tricritical phenomenon |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5241884/ https://www.ncbi.nlm.nih.gov/pubmed/28098249 http://dx.doi.org/10.1038/srep40916 |
work_keys_str_mv | AT gaojinghui enhancingdielectricpermittivityforenergystoragedevicesthroughtricriticalphenomenon AT wangyan enhancingdielectricpermittivityforenergystoragedevicesthroughtricriticalphenomenon AT liuyongbin enhancingdielectricpermittivityforenergystoragedevicesthroughtricriticalphenomenon AT huxinghao enhancingdielectricpermittivityforenergystoragedevicesthroughtricriticalphenomenon AT kexiaoqin enhancingdielectricpermittivityforenergystoragedevicesthroughtricriticalphenomenon AT zhonglisheng enhancingdielectricpermittivityforenergystoragedevicesthroughtricriticalphenomenon AT heyuting enhancingdielectricpermittivityforenergystoragedevicesthroughtricriticalphenomenon AT renxiaobing enhancingdielectricpermittivityforenergystoragedevicesthroughtricriticalphenomenon |