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Enhancing dielectric permittivity for energy-storage devices through tricritical phenomenon

Although dielectric energy-storing devices are frequently used in high voltage level, the fast growing on the portable and wearable electronics have been increasing the demand on the energy-storing devices at finite electric field strength. This paper proposes an approach on enhancing energy density...

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Autores principales: Gao, Jinghui, Wang, Yan, Liu, Yongbin, Hu, Xinghao, Ke, Xiaoqin, Zhong, Lisheng, He, Yuting, Ren, Xiaobing
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5241884/
https://www.ncbi.nlm.nih.gov/pubmed/28098249
http://dx.doi.org/10.1038/srep40916
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author Gao, Jinghui
Wang, Yan
Liu, Yongbin
Hu, Xinghao
Ke, Xiaoqin
Zhong, Lisheng
He, Yuting
Ren, Xiaobing
author_facet Gao, Jinghui
Wang, Yan
Liu, Yongbin
Hu, Xinghao
Ke, Xiaoqin
Zhong, Lisheng
He, Yuting
Ren, Xiaobing
author_sort Gao, Jinghui
collection PubMed
description Although dielectric energy-storing devices are frequently used in high voltage level, the fast growing on the portable and wearable electronics have been increasing the demand on the energy-storing devices at finite electric field strength. This paper proposes an approach on enhancing energy density under low electric field through compositionally inducing tricriticality in Ba(Ti,Sn)O(3) ferroelectric material system with enlarged dielectric response. The optimal dielectric permittivity at tricritical point can reach to ε(r) = 5.4 × 10(4), and the associated energy density goes to around 30 mJ/cm(3) at the electric field of 10 kV/cm, which exceeds most of the selected ferroelectric materials at the same field strength. The microstructure nature for such a tricritical behavior shows polarization inhomogeneity in nanometeric scale, which indicates a large polarizability under external electric field. Further phenomenological Landau modeling suggests that large dielectric permittivity and energy density can be ascribed to the vanishing of energy barrier for polarization altering caused by tricriticality. Our results may shed light on developing energy-storing dielectrics with large permittivity and energy density at low electric field.
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spelling pubmed-52418842017-01-23 Enhancing dielectric permittivity for energy-storage devices through tricritical phenomenon Gao, Jinghui Wang, Yan Liu, Yongbin Hu, Xinghao Ke, Xiaoqin Zhong, Lisheng He, Yuting Ren, Xiaobing Sci Rep Article Although dielectric energy-storing devices are frequently used in high voltage level, the fast growing on the portable and wearable electronics have been increasing the demand on the energy-storing devices at finite electric field strength. This paper proposes an approach on enhancing energy density under low electric field through compositionally inducing tricriticality in Ba(Ti,Sn)O(3) ferroelectric material system with enlarged dielectric response. The optimal dielectric permittivity at tricritical point can reach to ε(r) = 5.4 × 10(4), and the associated energy density goes to around 30 mJ/cm(3) at the electric field of 10 kV/cm, which exceeds most of the selected ferroelectric materials at the same field strength. The microstructure nature for such a tricritical behavior shows polarization inhomogeneity in nanometeric scale, which indicates a large polarizability under external electric field. Further phenomenological Landau modeling suggests that large dielectric permittivity and energy density can be ascribed to the vanishing of energy barrier for polarization altering caused by tricriticality. Our results may shed light on developing energy-storing dielectrics with large permittivity and energy density at low electric field. Nature Publishing Group 2017-01-18 /pmc/articles/PMC5241884/ /pubmed/28098249 http://dx.doi.org/10.1038/srep40916 Text en Copyright © 2017, The Author(s) http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Article
Gao, Jinghui
Wang, Yan
Liu, Yongbin
Hu, Xinghao
Ke, Xiaoqin
Zhong, Lisheng
He, Yuting
Ren, Xiaobing
Enhancing dielectric permittivity for energy-storage devices through tricritical phenomenon
title Enhancing dielectric permittivity for energy-storage devices through tricritical phenomenon
title_full Enhancing dielectric permittivity for energy-storage devices through tricritical phenomenon
title_fullStr Enhancing dielectric permittivity for energy-storage devices through tricritical phenomenon
title_full_unstemmed Enhancing dielectric permittivity for energy-storage devices through tricritical phenomenon
title_short Enhancing dielectric permittivity for energy-storage devices through tricritical phenomenon
title_sort enhancing dielectric permittivity for energy-storage devices through tricritical phenomenon
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5241884/
https://www.ncbi.nlm.nih.gov/pubmed/28098249
http://dx.doi.org/10.1038/srep40916
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