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Electrostatic-free piezoresponse force microscopy

Contact and non-contact based atomic force microscopy (AFM) approaches have been extensively utilized to explore various nanoscale surface properties. In most AFM-based measurements, a concurrent electrostatic effect between the AFM tip/cantilever and sample surface can occur. This electrostatic eff...

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Detalles Bibliográficos
Autores principales:	Kim, Sungho, Seol, Daehee, Lu, Xiaoli, Alexe, Marin, Kim, Yunseok
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Nature Publishing Group 2017
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5282565/ https://www.ncbi.nlm.nih.gov/pubmed/28139715 http://dx.doi.org/10.1038/srep41657

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